Topographical development and misfit relief in laser-ablated heteroepitaxial YBa2Cu3O7-δ thin films

Journal of Crystal Growth

Volumn 172, Issue 1-2, 1997, Pages 145-155

  Yeadon, M ^a,b   Aindow, M ^b   Wellhofer F ^b   Abell, J S ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; SUBSTRATES; SURFACES;

BURGERS VECTOR; HETEROEPITAXIAL THIN FILMS; SURFACE ORIENTATIONS; SURFACE TOPOGRAPHY;

THIN FILMS;

EID: 0031546740     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00723-3     Document Type: Article

References (32)

1. M.K. Wu, J.R. Ashburn, C.J. Torng, P.H. Hor, R.L. Meng, L. Gao, Z.J. Huang, Y.Q. Wang and C.W. Chu, Phys. Rev. Lett. 58 (1987) 908.
2. G. Kästner, D. Hesse, R. Scholz, H. Koch, F. Ludwig, M. Lorenz and H. Kittel, Physica C 243 (1995) 281.
3. T. Terashima, Y. Bando, K. Iijima, K. Yamamoto, K. Hirata, K. Hayashi, K. Kamigaki and H. Terauchi, Phys. Rev. Lett. 65 (1990) 2684.
4. S.J. Pennycook, M.F. Chisolm, D.E. Jesson, R. Feenstra, S. Zhu, X.Y. Zheng and D.J. Lowndes, Physica C 202 (1992) 1.
5. M.G. Norton and C.B. Carter, J. Crystal Growth 110 (1991) 641.
6. J.W. Matthews and J.L. Crawford, Thin Solid Films 5 (1970) 187.
7. M.G. Norton and C.B. Carter, Physica C 172 (1990) 47.
8. S.K. Strieffer, B.M. Lairson, C.B. Eom, B.M. Clemens, J.C. Bravman and T.H. Geballe, Phys. Rev. B 43 (1991) 13007.
9. Q. Li, O. Meyer, X.X. Xi, J. Geerk and G. Linker, Appl. Phys. Lett. 55 (1989) 310.
10. M. Bauer, F. Baudenbacher and H. Kinder, Physica C 246 (1995) 113.
11. M. Aindow, D.J. Norris and T.T. Cheng, Philos. Mag. Lett. 74 (1996) 267.
12. M. Hawley, I.D. Raistrick, J.G. Beery and R.J. Houlton, Science 251 (1991) 1587.
13. Ch. Gerber, D. Anselmetti, J.G. Bednorz, J. Mannhart and D.G. Schlom, Nature 350 (1991) 279.
14. H.P. Lang, T. Frey and H.J. Güntherodt, Europhys. Lett. 15 (1991) 667.
15. M. Yeadon, M. Aindow, F.W. Wellhöfer and J.S. Abell, in: Electron Microscopy and Analysis 1993, Inst. Phys. Conf. Ser. 138, Ed. A.J. Craven (IOPP, Bristol, 1993) p.283.
16. D.G. Schlom, D. Anselmetti, J.G. Bednorz, R.F. Broom, A. Catana, T. Frey, Ch. Gerber, H.J. Güntherodt, H.P. Lang and J. Mannhart, Z. Phys. B 86 (1992) 163.
17. J. Mannhart, D. Anselmetti, J.G. Bednorz, A. Catana, C. Gerber, K.A. Müller and D.G. Schlom, Z. Phys. B 86 (1992) 177.
18. M. Yeadon, M. Aindow, J.S. Abell, M. Slaski, C.E. Gough, P. Woodall and F.W. Wellhöfer, in: Applied Superconductivity 1995, Inst. Phys. Conf. Ser. 148, Ed. D. Dew-Hughes (IOPP, Bristol, 1995) p. 991.
19. F.C. Frank, Discuss. Faraday Soc. 5 (1949) 48.
20. W.K. Burton, N. Cabrera and F.C. Frank, Philos. Trans. R. Soc. A 243 (1951) 299.
21. A. Baronnet, J. Crystal Growth 19 (1973) 193.
22. D.G. Schlom, D. Anselmetti, J.G. Bednorz, Ch. Gerber and J. Mannhart, in: Evolution of Surface and Thin Film Microstructure, Mater. Res. Soc. Symp. Proc. 280, Eds. H.A. Atwater, E. Chason, M.H. Grabow and M.G. Lagally (MRS, Pittsburgh, Pennsylvania, 1993) p. 341.
23. M. Aindow and M. Yeadon, Philos. Mag. Lett. 70 (1994) 47.
24. M. Yeadon, PhD Thesis, The University of Birmingham (1995).
25. D. Dijkkamp, T. Venkatesan, X.D. Wu, S.A. Shaheen, N. Jisrawi, Y.H. Min-Lee, W.L. McLean and M. Croft, Appl. Phys. Lett. 51 (1987) 619.
26. W.K. Chu, J.W. Mayer and M.A. Nicholet, in: Backscattering Spectrometry (Academic Press, New York, 1978) p. 223.
27. M. Yeadon, M. Aindow, F.W. Wellhöfer, J.S. Abell, B. Avenhaus, M.J. Lancaster and P. Woodall, IEEE Trans. Appl. Supercond. 5 (1995) 1214.
28. M. Hawley, I.D. Raistrick, R.J. Houlton, F.H. Garzon and M. Piza, Ultramicroscopy 42-44 (1992) 705.
29. R. Beanland, C.J. Kiely and R.C. Pond, in: Handbook on Semiconductors 3, Eds. T.S. Moss and S. Mahajan (North-Holland, Amsterdam, 1994) p. 1149.
30. J.C.M. Li, in: Recrystallisation, Grain Growth and Textures (ASM, Ohio, 1966) p. 45.
31. M. Aindow, J.L. Batstone, L. Pfeiffer, J.M. Phillips and R.C. Pond, in: Characterisation of the Structure and Chemistry of Defects in Materials, Mater. Res. Soc. Symp. Proc. 138, Eds. B.C. Larson, M. Rühle and D.N. Seidman (Materials Research Society, Pittsburgh, Pennsylvania, 1989) p. 373.
32. B. Mutaftschiev, in: Dislocations in Solids, Ed. F.R.N. Nabarro (North-Holland, Amsterdam, 1980) p. 57.