-
1
-
-
0016562918
-
-
Abrahams, M. S., Buiocchi, C. J., and Olsen, G. H., 1975, J. appl. Phys., 46, 4259.
-
(1975)
J. Appl. Phys.
, vol.46
, pp. 4259
-
-
Abrahams, M.S.1
Buiocchi, C.J.2
Olsen, G.H.3
-
2
-
-
0000441755
-
-
Abrahams, M. S., Weisberg, L. R., Buiocchi, C. J., and Blanc, L., 1969, J. Mater. Sei., 4, 223.
-
(1969)
J. Mater. Sei.
, vol.4
, pp. 223
-
-
Abrahams, M.S.1
Weisberg, L.R.2
Buiocchi, C.J.3
Blanc, L.4
-
3
-
-
0026222859
-
-
Abramof, E., Hingerl, K., Pesek, A., and Sitter, H., 1991, Semicond. Sei. Tech., 6, A80.
-
(1991)
Semicond. Sei. Tech.
, vol.6
, pp. A80
-
-
Abramof, E.1
Hingerl, K.2
Pesek, A.3
Sitter, H.4
-
4
-
-
33144456500
-
-
Abstreiter, G., Brugger, H., Wolf, T., Jorke, H., and Herzog, H. J., 1985, Phys. Rev. Lett., 54, 2441.
-
(1985)
Phys. Rev. Lett.
, vol.54
, pp. 2441
-
-
Abstreiter, G.1
Brugger, H.2
Wolf, T.3
Jorke, H.4
Herzog, H.J.5
-
5
-
-
0022027146
-
-
Anderson, N. G., Laidig, W. D., and Lin, Y. F., 1985, J. electron. Mater., 14, 187.
-
(1985)
J. Electron. Mater.
, vol.14
, pp. 187
-
-
Anderson, N.G.1
Laidig, W.D.2
Lin, Y.F.3
-
6
-
-
0001087638
-
-
Andersson, T. G., Chen, Z. G., Kulakovskii, V. D., Uddin, A., and Vallin, J. T., 1987, Appl. Phys. Lett., 51, 752.
-
(1987)
Appl. Phys. Lett.
, vol.51
, pp. 752
-
-
Andersson, T.G.1
Chen, Z.G.2
Kulakovskii, V.D.3
Uddin, A.4
Vallin, J.T.5
-
7
-
-
0040029407
-
-
Institute of Physics Conference Series, No. 134 (Bristol: Institute of Physics
-
Armigliato, A., Balboni, R., De Wolf, I., Frabboni, S., Janssens, K. G. F., and Vanhellemont, J., 1993, Microscopy of Semiconducting Materials 1989, Institute of Physics Conference Series, No. 134 (Bristol: Institute of Physics), p. 229.
-
(1993)
Microscopy of Semiconducting Materials 1989
, pp. 229
-
-
Armigliato, A.1
Balboni, R.2
De Wolf, I.3
Frabboni, S.4
Janssens, K.G.F.5
Vanhellemont, J.6
-
8
-
-
3643060612
-
-
Atkinson, A., and Jain, S. C., 1993, J. Phys., Paris, 5, 4595.
-
(1993)
J. Phys., Paris
, vol.5
, pp. 4595
-
-
Atkinson, A.1
Jain, S.C.2
-
9
-
-
0026225250
-
-
Ayers, J. E., Ghandi, S. K., and Schowalter, L. J., 1991, J. Cryst. Growth, 113, 430.
-
(1991)
J. Cryst. Growth
, vol.113
, pp. 430
-
-
Ayers, J.E.1
Ghandi, S.K.2
Schowalter, L.J.3
-
11
-
-
0042913534
-
-
Beam, E. A., and Kao, Y. C., 1991, J. appl. Phys., 69, 4253.
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 4253
-
-
Beam, E.A.1
Kao, Y.C.2
-
12
-
-
84956263829
-
-
Bean, J. C., Feldman, L. C., Fiory, A. T., Nakahara, S., and Robinson, I. K., 1984, J. vac. Sei. Technol., A, 2, 436.
-
(1984)
J. Vac. Sei. Technol
-
-
Bean, J.C.1
Feldman, L.C.2
Fiory, A.T.3
Nakahara, S.4
Robinson, I.K.5
-
13
-
-
36449002154
-
-
Beanland, R., 1992, J. appl. Phys., 72, 4031; 1993, Phil. Mag. A, 67, 585.
-
(1992)
J. Appl. Phys., 72, 4031; 1993, Phil. Mag. A
, vol.67
, pp. 585
-
-
Beanland, R.1
-
14
-
-
85024026926
-
-
to be published
-
Beanland, R., Aindow, M., Joyce, T. B., Kidd, P., Lourenço, M. A., and Goodhew, P. J., 1995, J. Cryst. Growth (to be published).
-
(1995)
J. Cryst. Growth
-
-
Beanland, R.1
Aindow, M.2
Joyce, T.B.3
Kidd, P.4
Lourenço, M.A.5
Goodhew, P.J.6
-
15
-
-
3643148127
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
Beanland, R., and Goodhew, P. J., 1993, Microscopy of Semiconducting Materials, 1989, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 215.
-
(1993)
Microscopy of Semiconducting Materials, 1989
, pp. 215
-
-
Beanland, R.1
Goodhew, P.J.2
-
16
-
-
0004281127
-
-
Amsterdam: North-Holland
-
Beanland, R., Kiely, C. J., and Pond, R. C., 1994, Handbook on Semiconductors (Amsterdam: North-Holland), p. 1149.
-
(1994)
Handbook on Semiconductors
, pp. 1149
-
-
Beanland, R.1
Kiely, C.J.2
Pond, R.C.3
-
17
-
-
3643148128
-
-
Institute of Physics Conference Series No. 117 (Bristol: Institute of Physics)
-
BEANLAND, R., and POND, R. C., 1989, International Symposium on the Structure and Properties of Dislocations in Semiconductors 1989, Institute of Physics Conference Series No. 117 (Bristol: Institute of Physics), p. 455.
-
(1989)
International Symposium on the Structure and Properties of Dislocations in Semiconductors 1989
, pp. 455
-
-
Beanland, R.1
Pond, R.C.2
-
18
-
-
0027590522
-
-
BENLAHSEN, M., LÉPINOUX, J., and GRILHÉ, J., 1993, Mater. Sei. Engng A164, 428.
-
(1993)
Mater. Sei. Engng
, vol.A164
, pp. 428
-
-
Benlahsen, M.1
Lépinoux, J.2
Grilhé, J.3
-
19
-
-
0027609336
-
-
BENSAADA, M., COCHRANE, R. W., MASUT, R. A., LEONELLI, R., and KAJRYS, G., 1993, J. Cryst. Growth, 130, 433.
-
(1993)
J. Cryst. Growth
, vol.130
, pp. 433
-
-
Bensaada, M.1
Cochrane, R.W.2
Masut, R.A.3
Leonelli, R.4
Kajrys, G.5
-
20
-
-
33846389519
-
-
BERGER, P. R., CHANG, K., BATTACHARYA, P., SINGH, J., and Bajaj, K. K„ 1988, Appl. Phys. Lett., 53, 684.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 684
-
-
Berger, P.R.1
Chang, K.2
Battacharya, P.3
Singh, J.4
Bajaj, K.K.5
-
21
-
-
3643093943
-
-
Biefeld, R. M., Gourley, P. L., Fritz, I. J., and Osbourn, G. C., 1983, Appl. Phys. Lett., 43, 759.
-
(1983)
Appl. Phys. Lett.
, vol.43
, pp. 759
-
-
Biefeld, R.M.1
Gourley, P.L.2
Fritz, I.J.3
Osbourn, G.C.4
-
22
-
-
0024069115
-
-
BIEFELD, R. M., HILLS, C. R., and LEE, S. R., 1988, J. Cryst. Growth, 91, 515.
-
(1988)
J. Cryst. Growth
, vol.91
, pp. 515
-
-
Biefeld, R.M.1
Hills, C.R.2
Lee, S.R.3
-
23
-
-
0026942935
-
-
Biefeld, R. M., Kurtz, S. R., and Casalnuovo, S. A., 1992, J. Cryst. Growth, 124, 401.
-
(1992)
J. Cryst. Growth
, vol.124
, pp. 401
-
-
Biefeld, R.M.1
Kurtz, S.R.2
Casalnuovo, S.A.3
-
24
-
-
0004226632
-
-
BOOKER, G. R., TITCHMARSH, J. M., FLETCHER, J., DARBY, D. B., HOCKLY, M., and AL-JASSIM, M., 1978, J. Cryst. Growth, 45, 407.
-
(1978)
J. Cryst. Growth
, vol.45
, pp. 407
-
-
Booker, G.R.1
Titchmarsh, J.M.2
Fletcher, J.3
Darby, D.B.4
Hockly, M.5
Al-Jassim, M.6
-
25
-
-
0025555001
-
-
BRADLEY, R. R., BESWICK, J. A., JOYCE, T. B., HODSON, P. D., KIGHTLEY, P., TAYLOR, R. I., STIRLAND, D. J., and Griffiths, R. J. M., 1990, Vacuum, 40, 339.
-
(1990)
Vacuum
, vol.40
, pp. 339
-
-
Bradley, R.R.1
Beswick, J.A.2
Joyce, T.B.3
Hodson, P.D.4
Kightley, P.5
Taylor, R.I.6
Stirland, D.J.7
Griffiths, R.J.M.8
-
26
-
-
0345768208
-
-
BROWN, G. T., KIER, A. M., GIBBS, M. J., GEISS, J., IRVINE, S. J. C., and Astles, M. G., 1989, Electrochem. Soc. Symp. Proc., 89, 171.
-
(1989)
Electrochem. Soc. Symp. Proc.
, vol.89
, pp. 171
-
-
Brown, G.T.1
Kier, A.M.2
Gibbs, M.J.3
Geiss, J.4
Irvine, S.J.C.5
Astles, M.G.6
-
27
-
-
3643131477
-
-
CAO, D. S., CHEN, C. H., FRY, K. L., REIHLEN, E. H., and STRINGFELLOW, G. B., 1989, J. appl. Phys., 65, 2451.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2451
-
-
Cao, D.S.1
Chen, C.H.2
Fry, K.L.3
Reihlen, E.H.4
Stringfellow, G.B.5
-
28
-
-
21144479421
-
-
Celii, F. G., Files-Sesler, L. A., Beam, E. A., and Liu, H. Y., 1993a, J. vac. Sei. Technol. A, 11, 1796.
-
(1993)
J. Vac. Sei. Technol. A
, pp. 11
-
-
Celii, F.G.1
Files-Sesler, L.A.2
Beam, E.A.3
Liu, H.Y.4
-
29
-
-
85023972502
-
-
Celii, F. G., Kao, Y. C., Liu, H. Y., Files-Sesler, L. A., and Beamill, E. A., 1993b, J. vac. Sei. Technol. B, 11, 1014.
-
(1993)
J. Vac. Sei. Technol. B
, pp. 11
-
-
Celii, F.G.1
Kao, Y.C.2
Liu, H.Y.3
Files-Sesler, L.A.4
Beamill, E.A.5
-
30
-
-
0000026038
-
-
CERDERIA, F., PINCZUK, A., BEAN, J. C., BATLOGG, B., and WILSON, B. A., 1984, Appl. Phys. Lett., 45, 1138.
-
(1984)
Appl. Phys. Lett.
, vol.45
, pp. 1138
-
-
Cerderia, F.1
Pinczuk, A.2
Bean, J.C.3
Batlogg, B.4
Wilson, B.A.5
-
31
-
-
0000048275
-
-
Chand, N., Becker, E. E., van der Ziel, J. P., Chu, S. N. G„ and Dutta, N. K., 1991, Appl. Phys. Lett., 58, 1704.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 1704
-
-
Chand, N.1
Becker, E.E.2
Van Der Ziel, J.P.3
Chu, S.N.G.4
Dutta, N.K.5
-
32
-
-
0001596105
-
-
CHANG, J. C. P., CHEN, J., FERNANDEZ, J. M., WIEDER, H. H., and KAVANAGH, K. L., 1992, Appl. Phys. Lett., 60, 1129.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 1129
-
-
Chang, J.C.P.1
Chen, J.2
Fernandez, J.M.3
Wieder, H.H.4
Kavanagh, K.L.5
-
33
-
-
0039851753
-
-
CHANG, J. C. P., CHIN, T. P., TU, C. W., and KAVANAGH, K. L., 1993, Appl. Phys. Lett., 63, 500.
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 500
-
-
Chang, J.C.P.1
Chin, T.P.2
Tu, C.W.3
Kavanagh, K.L.4
-
34
-
-
0345065976
-
-
Chang, K., Battacharya, P., and Lai, R., 1990, J. appl. Phys., 67, 3323.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 3323
-
-
Chang, K.1
Battacharya, P.2
Lai, R.3
-
35
-
-
36549094193
-
-
Chang, K. J., Battacharya, P. K., and Gibala, R., 1989, J. appl. Phys., 66, 2993.
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 2993
-
-
Chang, K.J.1
Battacharya, P.K.2
Gibala, R.3
-
36
-
-
85024034703
-
-
CHEN, J., FERNANDEZ, J. M., CHANG, J. C. P., KAVANAGH, K. L., and WIEDER, H. H., 1989, J. appl. Phys., 66, 520; 1992, Semicond. Sei. Technol., 7, 601.
-
(1989)
J. Appl. Phys., 66, 520; 1992, Semicond. Sei. Technol.
, vol.7
, pp. 601
-
-
Chen, J.1
Fernandez, J.M.2
Chang, J.C.P.3
Kavanagh, K.L.4
Wieder, H.H.5
-
37
-
-
3643119016
-
-
TMS
-
CHOI, C., OTSUKA, N., KOLODZIEJSKI, L. A., MELLOCH, M. R., and Gunshor, R. L., 1988, Proceedings of the Symposium on Dislocations and Interfaces in Semiconductors (TMS), p. 141.
-
(1988)
Proceedings of the Symposium on Dislocations and Interfaces in Semiconductors
, pp. 141
-
-
Choi, C.1
Otsuka, N.2
Kolodziejski, L.A.3
Melloch, M.R.4
Gunshor, R.L.5
-
38
-
-
0005917332
-
-
CHU, S. N. G., TSANG, W. T., CHIU, T. H., and Macrander, A. T., 1989, J. appl. Phys., 66, 520.
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 520
-
-
Chu, S.N.G.1
Tsang, W.T.2
Chiu, T.H.3
Macrander, A.T.4
-
39
-
-
0038199141
-
-
DAWSON, L. R., OSBOURN, G. C., ZIPPERIAN, T. E., WICZER, J. J., BARNES, C. E., FRITZ, I. J., and BIEFELD, R. M., 1984, J. vac. Sei. Technol. B, 2, 179.
-
(1984)
J. Vac. Sei. Technol. B
, vol.2
, pp. 179
-
-
Dawson, L.R.1
Osbourn, G.C.2
Zipperian, T.E.3
Wiczer, J.J.4
Barnes, C.E.5
Fritz, I.J.6
Biefeld, R.M.7
-
40
-
-
0027904542
-
-
De Boeck, J., and Borghs, G., 1993, J. Cryst. Growth, 127, 85.
-
(1993)
J. Cryst. Growth
, vol.127
, pp. 85
-
-
De Boeck, J.1
Borghs, G.2
-
42
-
-
85176529859
-
-
Dodson, B. W., 1988, Appl. Phys. Lett., 53, 37; 1990, J. electron. Mater., 19, 503.
-
(1988)
Appl. Phys. Lett., 53, 37; 1990, J. Electron. Mater.
, vol.19
, pp. 503
-
-
Dodson, B.W.1
-
43
-
-
0004727293
-
-
51, 1325; 1988
-
Dodson, B. W„ and Tsao, J. Y., 1987, Appl. Phys. Lett., 51, 1325; 1988, 53, 2498.
-
(1987)
Appl. Phys. Lett.
, vol.53
, pp. 2498
-
-
Dodson, B.W.1
Tsao, J.Y.2
-
44
-
-
36549095574
-
-
DRIGO, A. V., AYDINLI, A., CARNERA, A., GENOVA, F., RIGO, C., FERRARI, C., FRANZIOSI, P., and Salvati, G., 1989, J. appl. Phys., 66, 1975.
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 1975
-
-
Drigo, A.V.1
Aydinli, A.2
Carnera, A.3
Genova, F.4
Rigo, C.5
Ferrari, C.6
Franziosi, P.7
Salvati, G.8
-
46
-
-
0027539996
-
-
DUNSTAN, D. J., DIXON, R. H., KIDD, P., HOWARD, L. K., WILKINSON, V. A., LAMBKIN, J. D., JEYNES, C., HALSALL, M. P., LANCEFIELD, D., EMENY, M. T., GOODHEW, P. J., HOMEWOOD, K. P., SEALY, B. J., and ADAMS, A. R., 1993, J. Cryst. Growth, 126, 589.
-
(1993)
J. Cryst. Growth
, vol.126
, pp. 589
-
-
Dunstan, D.J.1
Dixon, R.H.2
Kidd, P.3
Howard, L.K.4
Wilkinson, V.A.5
Lambkin, J.D.6
Jeynes, C.7
Halsall, M.P.8
Lancefield, D.9
Emeny, M.T.10
Goodhew, P.J.11
Homewood, K.P.12
Sealy, B.J.13
Adams, A.R.14
-
47
-
-
5344236298
-
-
DUNSTAN, D. J., KIDD, P., FEWSTER, P. F., ANDREW, N. L., GREY, R., DAVID, J. P. R., GONZÁLEZ, L., GONZALEZ, Y., SACEDÓN, A., and GONZÁLEZ-SANZ, F., 1994, Appl. Phys. Lett., 65, 839.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 839
-
-
Dunstan, D.J.1
Kidd, P.2
Fewster, P.F.3
Rew, N.L.4
Grey, R.5
David, J.P.R.6
González, L.7
Gonzalez, Y.8
Sacedón, A.9
González-Sanz, F.10
-
48
-
-
36449002778
-
-
Dunstan, D. J., Young, S., and Dixon, R. H., 1991, J. appl. Phys., 70, 3038.
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 3038
-
-
Dunstan, D.J.1
Young, S.2
Dixon, R.H.3
-
49
-
-
3643049079
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
Durose, K., and Tatsuoka, H., 1993, Microscopy of Semiconducting Materials VIII, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 581.
-
(1993)
Microscopy of Semiconducting Materials VIII
, pp. 581
-
-
Durose, K.1
Tatsuoka, H.2
-
50
-
-
3643130905
-
-
Eaglesham, D. J., and Cerullo, M., 1990, Phys. Rev. Lett., 64, 1943.
-
(1990)
Phys. Rev. Lett.
, vol.64
, pp. 1943
-
-
Eaglesham, D.J.1
Cerullo, M.2
-
51
-
-
0008908334
-
-
EAGLESHAM, D. J., GOSSMANN, H. J., CERULLO, M., PFEIFFER, L. N., and WEST, K. W., 1991, J. Cryst. Growth, 111, 883.
-
(1991)
J. Cryst. Growth
, vol.111
, pp. 883
-
-
Eaglesham, D.J.1
Gossmann, H.J.2
Cerullo, M.3
Pfeiffer, L.N.4
West, K.W.5
-
52
-
-
38549117286
-
-
EAGLESHAM, D. J., KVAM, E. P., MAHER, D. M., HUMPHREYS, C. J., GREEN, G. S., TANNER, B. K„ and BEAN, J. C., 1988, Appl. Phys. Lett., 53, 2083.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2083
-
-
Eaglesham, D.J.1
Kvam, E.P.2
Maher, D.M.3
Humphreys, C.J.4
Green, G.S.5
Tanner, B.K.6
Bean, J.C.7
-
53
-
-
0000471839
-
-
ELMAN, B., KOTELES, E. S., MELMAN, P., JAGANNATH, C., LEE, J., and DUGGER, D., 1989, Appl. Phys. Lett., 55, 1659.
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 1659
-
-
Elman, B.1
Koteles, E.S.2
Melman, P.3
Jagannath, C.4
Lee, J.5
Dugger, D.6
-
54
-
-
0344459811
-
-
El-Masry, N. A., Tarn, J. C. L., and Bedair, S. M., 1989, Appl. Phys. Lett., 55, 1442.
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 1442
-
-
El-Masry, N.A.1
Tarn, J.C.L.2
Bedair, S.M.3
-
55
-
-
0004023634
-
-
El-Masry, N. A., Tarn, J. C. L., and Karam, N. H., 1988, J. appl. Phys., 64, 3672.
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 3672
-
-
El-Masry, N.A.1
Tarn, J.C.L.2
Karam, N.H.3
-
56
-
-
0014707790
-
-
Esaki, L., and Tsu, R., 1970, IBM Jl Res. Develop., 14, 61.
-
(1970)
IBM Jl Res. Develop.
, vol.14
, pp. 61
-
-
Esaki, L.1
Tsu, R.2
-
57
-
-
21544466765
-
-
FANG, S. F., ADOMI, K., IYER, S., MORKOÇ, H., ZABEL, H., CHOI, C., and OTSUKA, N., 1990, J. appl. Phys., 68, R31.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. R31
-
-
Fang, S.F.1
Adomi, K.2
Iyer, S.3
Morkoç, H.4
Zabel, H.5
Choi, C.6
Otsuka, N.7
-
59
-
-
0001551941
-
-
Feng, X., and Hirth, J. P., 1992, J. appl. Phys., 12, 1386.
-
(1992)
J. Appl. Phys.
, vol.12
, pp. 1386
-
-
Feng, X.1
Hirth, J.P.2
-
61
-
-
21544456439
-
-
Fewster, P. F., and Andrew, N. L., 1993, J. appl. Phys., 74, 3121.
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 3121
-
-
Fewster, P.F.1
Andrew, N.L.2
-
62
-
-
3643054310
-
-
25 (Pittsburgh, PA: Materials Research Society
-
Fiory, A. T., 1986, Mater. Res. Soc. Symp. Proc., 25 (Pittsburgh, PA: Materials Research Society), p. 497
-
(1986)
Mater. Res. Soc. Symp. Proc.
, pp. 497
-
-
Fiory, A.T.1
-
63
-
-
0021481961
-
-
FIORY, A. T., BEAN, J. C., FELDMAN, L. C., and ROBINSON, I. K., 1984, J. Appl. Phys., 56, 1227.
-
(1984)
J. Appl. Phys.
, vol.56
, pp. 1227
-
-
Fiory, A.T.1
Bean, J.C.2
Feldman, L.C.3
Robinson, I.K.4
-
64
-
-
0005326536
-
-
FIORY, A. T., BEAN, J. C., HULL, R„ and Nakahara, S., 1985, Phys. Rev. B, 31, 4063.
-
(1985)
Phys. Rev. B
, vol.31
, pp. 4063
-
-
Fiory, A.T.1
Bean, J.C.2
Hull, R.3
Nakahara, S.4
-
65
-
-
36549091128
-
-
FISCHER, R., MORKOÇ, H., NEUMANN, D. A., ZABEL, H., CHOI, C., OTSUKA, N., LONGERBONE, M., and ERIKSON, L. P., 1986A, J. appl. Phys., 60, 1640.
-
(1986)
J. Appl. Phys.
, vol.1640
, pp. 60
-
-
Fischer, R.1
Morkoç, H.2
Neumann, D.A.3
Zabel, H.4
Choi, C.5
Otsuka, N.6
Longerbone, M.7
Erikson, L.P.8
-
66
-
-
0000575813
-
-
FISCHER, R., NEUMANN, D. A., ZABEL, H., MORKOÇ, H., CHOI, C., and OTSUKA, N., 1986b, Appl. Phys. Lett., 48, 1223.
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 1223
-
-
Fischer, R.1
Neumann, D.A.2
Zabel, H.3
Morkoç, H.4
Choi, C.5
Otsuka, N.6
-
67
-
-
0026259968
-
-
Fitzgerald, E. A., 2979, J. vac. Sei. Technol. B, 7, 782; 1991, Mater. Sei. Rep., 7, 87.
-
(1991)
J. Vac. Sei. Technol. B, 7, 782; 1991, Mater. Sei. Rep.
, vol.7
, pp. 87
-
-
Fitzgerald, E.A.1
-
68
-
-
0041756534
-
-
Fitzgerald, E. A., Ast, D. G., Ashizawa, Y., Akbar, S., and Eastman, L. F., 1988a, J. appl. Phys., 64, 2473.
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 2473
-
-
Fitzgerald, E.A.1
Ast, D.G.2
Ashizawa, Y.3
Akbar, S.4
Eastman, L.F.5
-
69
-
-
36549098359
-
-
Fitzgerald, E. A., Ast, D. G., Kirchner, P. D., Pettit, G. D., and Woodall, J. M., 1988b, J. appl. Phys., 63, 693.
-
(1988)
J. Appl. Phys.
, vol.63
, pp. 693
-
-
Fitzgerald, E.A.1
Ast, D.G.2
Kirchner, P.D.3
Pettit, G.D.4
Woodall, J.M.5
-
70
-
-
21544434863
-
-
FITZGERALD, E. A., WATSON, G. P., PROANO, R. E., AST, D. G., KIRCHNER, P. D., PETTIT, G. D., and Woodall, J. M., 1989, J. appl. Phys., 65, 2220.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2220
-
-
Fitzgerald, E.A.1
Watson, G.P.2
Proano, R.E.3
Ast, D.G.4
Kirchner, P.D.5
Pettit, G.D.6
Woodall, J.M.7
-
71
-
-
0343578945
-
-
FITZGERALD, E. A., XIE, Y. H., GREEN, M. L., BRASEN, D., KORTAN, A. R., MICHEL, J., MII, Y. J., and WEIR, B. E., 1991, Appl. Phys. Lett., 59, 811.
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 811
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Green, M.L.3
Brasen, D.4
Kortan, A.R.5
Michel, J.6
Mii, Y.J.7
Weir, B.E.8
-
72
-
-
84872544212
-
-
Fitzgerald, E. A., Xie, Y. H., Monroe, D., Silverman, P. J., Kuo, J. M., Kortan, A. R., Thiel, F. A., and Weir, B. E., 1992a, J. vac. Sei. Technol. B, 10, 1807.
-
(1992)
J. Vac. Sei. Technol. B
, vol.1807
, pp. 10
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Monroe, D.3
Silverman, P.J.4
Kuo, J.M.5
Kortan, A.R.6
Thiel, F.A.7
Weir, B.E.8
-
73
-
-
3643128335
-
-
Fitzgerald, E. A., Xie, Y. H., Monroe, D., Silverman, P. J., and Watson, G. P., 1992b, J. appl. Phys. Lett., 73, 8364.
-
(1992)
J. Appl. Phys. Lett.
, vol.73
, pp. 8364
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Monroe, D.3
Silverman, P.J.4
Watson, G.P.5
-
74
-
-
36549101276
-
-
Fox, B. A., and Jesser, W. A., 1990, J. appl. Phys., 68, 2739.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 2739
-
-
Fox, B.A.1
Jesser, W.A.2
-
75
-
-
0000440628
-
-
198, 205; 1949b, 198
-
Frank, F. C., and Van der Merwe, J. H., 1949a, Proc. R. Soc. A, 198, 205; 1949b, 198, 216.
-
(1949)
Proc. R. Soc. A
, pp. 216
-
-
Frank, F.C.1
Van Der Merwe, J.H.2
-
77
-
-
36549104246
-
-
Freund, L. B„ 1990a, J. appl. Phys., 68, 2073; 1990b, J. Mech. Phys. Solids, 35, 657; 1992a, Mater. Res. Soc. Bull., 17, 52; 1992b, Scripta Metall., 21, 669.
-
(1990)
J. Appl. Phys., 68, 2073; 1990B, J. Mech. Phys. Solids, 35, 657; 1992A, Mater. Res. Soc. Bull., 17, 52; 1992B, Scripta Metall.
, vol.21
, pp. 669
-
-
Freund, L.B.1
-
78
-
-
36549093752
-
-
FREUNDLICH, A., GRENET, J. C., NEU, G., LEYCURAS, A., and VÈ, C., 1988, Appl. Phys. Lett., 52, 1976.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 1976
-
-
Freundlich, A.1
Grenet, J.C.2
Neu, G.3
Leycuras, A.4
Vè, C.5
-
79
-
-
0001456917
-
-
Froyen, S., Wood, D. M., and Zunger, A., 1987, Phys. Rev. B, 35, 4547.
-
(1987)
Phys. Rev. B
, vol.35
, pp. 4547
-
-
Froyen, S.1
Wood, D.M.2
Zunger, A.3
-
80
-
-
0020115911
-
-
Fritz, I. J., Dawson, L. R., and Zipperian, T. E., 1983, J. vac. Sei. Technol. B, 1, 387.
-
(1983)
J. Vac. Sei. Technol. B
, vol.1
, pp. 387
-
-
Fritz, I.J.1
Dawson, L.R.2
Zipperian, T.E.3
-
81
-
-
0001399240
-
-
Fritz, I. J., Gourley, P. L., and Dawson, L. R., 1987, Appl. Phys. Lett., 51, 1004.
-
(1987)
Appl. Phys. Lett.
, vol.51
, pp. 1004
-
-
Fritz, I.J.1
Gourley, P.L.2
Dawson, L.R.3
-
82
-
-
0004824523
-
-
Fritz, I. J., Gourley, P. L., Dawson, L. R., and Schirber, J. E., 1988, Appl. Phys. Lett., 53, 1098.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 1098
-
-
Fritz, I.J.1
Gourley, P.L.2
Dawson, L.R.3
Schirber, J.E.4
-
83
-
-
0025403314
-
-
Gao, F., 1990, J. Phys. D, 23, 328.
-
(1990)
J. Phys. D
, vol.23
, pp. 328
-
-
Gao, F.1
-
84
-
-
21544463767
-
-
GAY, P., HIRSCH, P. B., and KELLY, A., 1953, Acta Metall, 1, 315.
-
(1953)
Acta Metall
, vol.1
, pp. 315
-
-
Gay, P.1
Hirsch, P.B.2
Kelly, A.3
-
85
-
-
0343701837
-
-
Ghandi, S. K., and Ayers, J. E., 1988, Appl. Phys. Lett., 53, 1204.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 1204
-
-
Ghandi, S.K.1
Ayers, J.E.2
-
86
-
-
0015974506
-
-
GNUTZMANN, U., and CLAUSECKER, K., 1974, J. appl. Phys., 38, 9.
-
(1974)
J. Appl. Phys.
, vol.38
, pp. 9
-
-
Gnutzmann, U.1
Clausecker, K.2
-
87
-
-
39849100352
-
-
GOSLING, T. J., JAIN, S. C., WILLIS, J. R., ATKINSON, A., and BULLOUGH, R., 1992, Phil. Mag., 66, 119.
-
(1992)
Phil. Mag.
, vol.66
, pp. 119
-
-
Gosling, T.J.1
Jain, S.C.2
Willis, J.R.3
Atkinson, A.4
Bullough, R.5
-
88
-
-
0020156778
-
J. Vac. Sei. Technol
-
Gourley, P. L., and Biefeld, R. M., 1982, J. vac. Sei. Technol. B, 21,473; 1983, 383.
-
(1982)
B, 21,473
, pp. 383
-
-
Gourley, P.L.1
Biefeld, R.M.2
-
89
-
-
0004047164
-
-
Gourley, P. L., Biefeld, R. M., and Dawson, L. R., 1985, Appl. Phys. Lett., 47, 482.
-
(1985)
Appl. Phys. Lett.
, vol.47
, pp. 482
-
-
Gourley, P.L.1
Biefeld, R.M.2
Dawson, L.R.3
-
90
-
-
0000683680
-
-
Gourley, P. L., Drummond, T. J., and Doyle, B. L., 1986, Appl. Phys. Lett., 49, 1101.
-
(1986)
Appl. Phys. Lett.
, vol.49
, pp. 1101
-
-
Gourley, P.L.1
Drummond, T.J.2
Doyle, B.L.3
-
91
-
-
0002510438
-
-
Gourley, P. L., Fritz, I. J., and Dawson, L. R., 1988, Appl. Phys. Lett., 52, 377.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 377
-
-
Gourley, P.L.1
Fritz, I.J.2
Dawson, L.R.3
-
92
-
-
3643080475
-
-
Grenning, D. A., and Herzog, A. H., 1968, J. appl. Phys., 39, 2783.
-
(1968)
J. Appl. Phys.
, vol.39
, pp. 2783
-
-
Grenning, D.A.1
Herzog, A.H.2
-
93
-
-
0006369789
-
-
Grundmann, M., Lienert, U., Christen, J., Bimberg, D., Fischer-Colbrie, A., and Miller, J. N., 1990, J. vac. Sei. Technol. B, 8, 751.
-
(1990)
J. Vac. Sei. Technol. B
, vol.8
, pp. 751
-
-
Grundmann, M.1
Lienert, U.2
Christen, J.3
Bimberg, D.4
Fischer-Colbrie, A.5
Miller, J.N.6
-
94
-
-
0026413298
-
-
GUHA, S., MADHUKAR, A., and Rajkumar, K. C., 1990, Appl. Phys. Lett., 57, 2110; 1991, J. Cryst. Growth, 111, 434.
-
(1990)
Appl. Phys. Lett., 57, 2110; 1991, J. Cryst. Growth
, vol.111
, pp. 434
-
-
Guha, S.1
Madhukar, A.2
Rajkumar, K.C.3
-
95
-
-
0024104379
-
-
Hamaguchi, N., Humphreys, T. P., Moore, D. J., Parker, C. A., Bedair, S. M., Tarn, J. C. L., Jiang, B. L., El-Masry, N., Radzimski, Z. J., and Rozgonyi, G. A., 1988, J. Cryst. Growth, 93, 449.
-
(1988)
J. Cryst. Growth
, vol.93
, pp. 449
-
-
Hamaguchi, N.1
Humphreys, T.P.2
Moore, D.J.3
Parker, C.A.4
Bedair, S.M.5
Tarn, J.C.L.6
Jiang, B.L.7
El-Masry, N.8
Radzimski, Z.J.9
Rozgonyi, G.A.10
-
96
-
-
0642298747
-
-
Hammons, B. E., Fritz, I. J., Brennan, T. M., Howard, A. J., and Olsen, J. A., 1993, J. vac. Sei. Technol, 11, 932.
-
(1993)
J. Vac. Sei. Technol
, vol.11
, pp. 932
-
-
Hammons, B.E.1
Fritz, I.J.2
Brennan, T.M.3
Howard, A.J.4
Olsen, J.A.5
-
98
-
-
85024061551
-
-
edited by J. C. C. Fan, J. M. Phillips and B. Y. Tsaur (Pittsburgh, Pennsylvania: Materials Research Society
-
Harris, J. S., Jr., Koch, S. M., and Rosner, S. J., 1987, Heteroepitaxy on Silicon II, Materials Research Society Symposium Proceedings, Vol. 91, edited by J. C. C. Fan, J. M. Phillips and B. Y. Tsaur (Pittsburgh, Pennsylvania: Materials Research Society), p. 91.
-
(1987)
Heteroepitaxy on Silicon II, Materials Research Society Symposium Proceedings
, vol.91
, pp. 91
-
-
Harris, J.S.1
Koch, S.M.2
Rosner, S.J.3
-
99
-
-
85024010036
-
-
Harmand, J. C., Matsumo, T., and Inoue, K., 1989, Jap. J. appl. Phys., 28, LI101.
-
(1989)
Jap. J. Appl. Phys
, vol.28
, pp. LI101
-
-
Harmand, J.C.1
Matsumo, T.2
Inoue, K.3
-
100
-
-
0000029386
-
-
Herbeaux, C., DiPersio, J., and Lefevbre, A., 1989, Appl. Phys. Lett., 54, 1004.
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 1004
-
-
Herbeaux, C.1
Dipersio, J.2
Lefevbre, A.3
-
101
-
-
0027539977
-
-
Higgs, V., Lightowlers, E. C., Fitzgerald, E. A., Xie, Y. H., and Silverman, P. J., 1993, J. appl. Phys., 73, 1952.
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 1952
-
-
Higgs, V.1
Lightowlers, E.C.2
Fitzgerald, E.A.3
Xie, Y.H.4
Silverman, P.J.5
-
102
-
-
36549102525
-
-
Hirth, J. P., and Feng, X., 1990, J. appl. Phys., 67, 33-43.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 33-43
-
-
Hirth, J.P.1
Feng, X.2
-
103
-
-
85024086342
-
-
Hirth, J. P., and Lothe, 1968.
-
(1968)
-
-
Hirth, J.P.1
-
104
-
-
0003598030
-
-
second edition (Malabar, Florda: Krieger
-
Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W., and Whelan, M. J., 1977, Electron Microscopy of Thin Crystals, second edition (Malabar, Florda: Krieger), p. 51.
-
(1977)
Electron Microscopy of Thin Crystals
, pp. 51
-
-
Hirsch, P.B.1
Howie, A.2
Nicholson, R.B.3
Pashley, D.W.4
Whelan, M.J.5
-
106
-
-
0027640042
-
-
HOLY, V., KUBENA, J., ABRAMOF, E., LISCHKA, K., PESEK, A., and KOPPENSTEINER, E., 1993, J. appl. Phys., 74, 1736.
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 1736
-
-
Holy, V.1
Kubena, J.2
Abramof, E.3
Lischka, K.4
Pesek, A.5
Koppensteiner, E.6
-
107
-
-
36549097465
-
-
Horikawa, H., Ogawa, Y., Kawai, Y., and Sakuta, M., 1988, Appl. Phys. Lett., 52, 397.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 397
-
-
Horikawa, H.1
Ogawa, Y.2
Kawai, Y.3
Sakuta, M.4
-
108
-
-
0025258242
-
-
Hou, H. Q., HUANG, Y., and ZHOU, J. M., 1990, J. Cryst. Growth, 99, 306.
-
(1990)
J. Cryst. Growth
, vol.99
, pp. 306
-
-
Hou, H.Q.1
Huang, Y.2
Zhou, J.M.3
-
109
-
-
45249128047
-
-
Houghton, D. C., Gibbings, J. J., Tuppen, C. G., Lyons, M. H., and Halliwell, M. A. G., 1989, Thin Solid Films, 183, 171.
-
(1989)
Thin Solid Films
, vol.183
, pp. 171
-
-
Houghton, D.C.1
Gibbings, J.J.2
Tuppen, C.G.3
Lyons, M.H.4
Halliwell, M.A.G.5
-
110
-
-
0027109610
-
-
Howard, L. K., Kidd, P., and Dixon, R. H., 1992, J. Cryst. Growth, 125, 281.
-
(1992)
J. Cryst. Growth
, vol.125
, pp. 281
-
-
Howard, L.K.1
Kidd, P.2
Dixon, R.H.3
-
112
-
-
0042286128
-
-
Huang, Y., Yu, P. Y., Charasse, M. N., Lo, Y., and Wang, S., 1987, Appl. Phys. Lett., 51, 192.
-
(1987)
Appl. Phys. Lett.
, vol.51
, pp. 192
-
-
Huang, Y.1
Yu, P.Y.2
Charasse, M.N.3
Lo, Y.4
Wang, S.5
-
114
-
-
3643060610
-
-
Hull, R., Bean, J. C., Bahnck, D., Peticolas, L. J., Jr., Short, K. T., and Unterwald, F. C., 1991, J. appl. Phys., 70, 2502.
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 2502
-
-
Hull, R.1
Bean, J.C.2
Bahnck, D.3
Peticolas, L.J.4
Short, K.T.5
Unterwald, F.C.6
-
115
-
-
0023042985
-
-
Hull, D., Bean, J. C., Cerdeira, F., Fiory, A. T., and Gibson, J. M., 1986, Appl. Phys. Lett., 48, 56.
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 56
-
-
Hull, D.1
Bean, J.C.2
Cerdeira, F.3
Fiory, A.T.4
Gibson, J.M.5
-
116
-
-
36549102816
-
-
Hull, R., Bean, J. C., Leibenguth, R. E., and Werder, D. J., 1989, J. appl. Phys., 65, 4723.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 4723
-
-
Hull, R.1
Bean, J.C.2
Leibenguth, R.E.3
Werder, D.J.4
-
117
-
-
0026413168
-
-
Inoue, K., Harmand, J. C., and Matsuno, T., 1991, J. Cryst. Growth, 111, 313.
-
(1991)
J. Cryst. Growth
, vol.111
, pp. 313
-
-
Inoue, K.1
Harmand, J.C.2
Matsuno, T.3
-
118
-
-
0023310784
-
-
ISHIDA, K., AKIYAMA, M., and NISHI, S., 1987, Jap. J. appl. Phys., 26, 163.
-
(1987)
Jap. J. Appl. Phys.
, vol.26
, pp. 163
-
-
Ishida, K.1
Akiyama, M.2
Nishi, S.3
-
119
-
-
36449002873
-
-
Ismail, K., Meyerson, B. S., and Wang, P. J., 1991a, Appl. Phys. Lett., 58, 2117; 1991b,.59, 973.
-
(1991)
Appl. Phys. Lett., 58, 2117; 1991B
, vol.59
, pp. 973
-
-
Ismail, K.1
Meyerson, B.S.2
Wang, P.J.3
-
120
-
-
36549093871
-
-
IYER, S. S., and LEGOUES, F. K., 1989, J. appl. Phys., 65, 4693.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 4693
-
-
Iyer, S.S.1
Legoues, F.K.2
-
121
-
-
0004830321
-
-
Jäger, W., StenKamp, D., Erhart, P., Liefer, K., Sybertz, W., Kibbel, H., Presting, H., and Kasper, E., 1992, Thin Solid Films, 222, 221.
-
(1992)
Thin Solid Films
, vol.222
, pp. 221
-
-
Jäger, W.1
Stenkamp, D.2
Erhart, P.3
Liefer, K.4
Sybertz, W.5
Kibbel, H.6
Presting, H.7
Kasper, E.8
-
122
-
-
0026909154
-
-
Jain, S. C., Gosling, T. J., Willis, J. R., Bullough, R., and Balk, P., 1992a, Solid-St. Electron., 35, 1073.
-
(1992)
Solid-St. Electron.
, vol.35
, pp. 1073
-
-
Jain, S.C.1
Gosling, T.J.2
Willis, J.R.3
Bullough, R.4
Balk, P.5
-
123
-
-
0000118649
-
-
Jain, S. C., Gosling, T. J., Willis, J. R., Totterdell, D. H. J., and Bullough, R., 1992b, Phil. Mag. A, 65, 1151.
-
(1992)
Phil. Mag. A
, vol.65
, pp. 1151
-
-
Jain, S.C.1
Gosling, T.J.2
Willis, J.R.3
Totterdell, D.H.J.4
Bullough, R.5
-
124
-
-
0001372818
-
-
JAIN, U., JAIN, S. C., ATKINSON, A., NIJS, J., MERTENS, R. P., and VAN OVERSTRAETEN, R., 1993a, J. appl. Phys., 73, 1773.
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 1773
-
-
Jain, U.1
Jain, S.C.2
Atkinson, A.3
Nijs, J.4
Mertens, R.P.5
Van Overstraeten, R.6
-
125
-
-
0027556349
-
-
JAIN, U., JAIN, S. C., Nus, J., WILLIS, J. R., BULLOUGH, R., MERTENS, R. P., and VAN OVERSTRAETEN, R., 1993b, Solid-St. Electron., 36, 331.
-
(1993)
Solid-St. Electron.
, vol.36
, pp. 331
-
-
Jain, U.1
Jain, S.C.2
Nus, J.3
Willis, J.R.4
Bullough, R.5
Mertens, R.P.6
Van Overstraeten, R.7
-
126
-
-
0000980721
-
-
JAIN, S. C., WILLIS, J. R., and BULLOUGH, R., 1990, Adv. Phys., 39, 127.
-
(1990)
Adv. Phys.
, vol.39
, pp. 127
-
-
Jain, S.C.1
Willis, J.R.2
Bullough, R.3
-
127
-
-
0025211496
-
-
JAROS, M., WONG, K. M., and TURTON, R. J., 1990, J. electron. Mater., 18, 35.
-
(1990)
J. Electron. Mater.
, vol.18
, pp. 35
-
-
Jaros, M.1
Wong, K.M.2
Turton, R.J.3
-
128
-
-
0001074110
-
-
KANATA, T., SUZAWA, H., MATSUNAGA, M., TAKAKURA, H., HAMAKAWA, Y., KATO, H., and NISHINO, T., 1990, Phys. Rev. B, 41, 2936.
-
(1990)
Phys. Rev. B
, pp. 41
-
-
Kanata, T.1
Suzawa, H.2
Matsunaga, M.3
Takakura, H.4
Hamakawa, Y.5
Kato, H.6
Nishino, T.7
-
129
-
-
0016426169
-
-
KASANO, H., and HOSOKI, S., 1975, J. appl. Phys., 46, 394.
-
(1975)
J. Appl. Phys.
, vol.46
, pp. 394
-
-
Kasano, H.1
Hosoki, S.2
-
130
-
-
0017524516
-
-
Kasper, E., and Herzog, H. J., 1977, Thin Solid Films, 44, 357.
-
(1977)
Thin Solid Films
, vol.44
, pp. 357
-
-
Kasper, E.1
Herzog, H.J.2
-
131
-
-
85024054531
-
-
3, 141; 1988, Materials Research Society Symposium Proceedings, Vol. 142 (Pittsburgh, Pennsylvania: Materials Research Society
-
KASPER, E., HERZOG, H. J., JORKE, H., and ABSTREITER, G., 1987, Superlatt. Microstruct., 3, 141; 1988, Materials Research Society Symposium Proceedings, Vol. 142 (Pittsburgh, Pennsylvania: Materials Research Society), p. 393.
-
(1987)
Superlatt. Microstruct.
, pp. 393
-
-
Kasper, E.1
Herzog, H.J.2
Jorke, H.3
Abstreiter, G.4
-
132
-
-
85024032462
-
-
KAVANAGH, K. L., CHANG, J. C. P., CHEN, J., FERNANDEZ, J. M., and WIEDER, H. H., 1992, J. vac. Sei. Technol. B, 10, 1820.
-
(1992)
J. Vac. Sei. Technol. B
, pp. 10
-
-
Kavanagh, K.L.1
Chang, J.C.P.2
Chen, J.3
Fernandez, J.M.4
Wieder, H.H.5
-
133
-
-
36448999080
-
-
KAWAI, T., YONEZU, H., OGASAWARA, Y., SAITO, D., and PAK, K., 1992, J. appl. Phys., 74, 257; 1993, Appl. Phys. Lett., 63, 2067.
-
(1992)
J. Appl. Phys., 74, 257; 1993, Appl. Phys. Lett.
, vol.63
, pp. 2067
-
-
Kawai, T.1
Yonezu, H.2
Ogasawara, Y.3
Saito, D.4
Pak, K.5
-
134
-
-
85024029953
-
-
Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published)
-
KIDD, P., DUNSTAN, D. J., GREY, R., DAVID, J., FEWSTER, P. F., ANDREW, N. L., MOLINA, S. I., and KIELY, C. J., 1993a, Microscopy of Semiconducting Materials VIII Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published).
-
(1993)
Microscopy of Semiconducting Materials VIII
-
-
Kidd, P.1
Dunstan, D.J.2
Grey, R.3
David, J.4
Fewster, P.F.5
Rew, N.L.6
Molina, S.I.7
Kiely, C.J.8
-
135
-
-
85024052926
-
-
Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published)
-
KIDD, P., FEWSTER, P. F., ANDREW, N. L., and DUNSTAN, D. J., 1993b, Microscopy of Semiconducting Materials VIII Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published).
-
(1993)
Microscopy of Semiconducting Materials VIII
-
-
Kidd, P.1
Fewster, P.F.2
Rew, N.L.3
Dunstan, D.J.4
-
136
-
-
0012829483
-
-
KLEM, J. F., FU, W. S., GOURLEY, P. L., JONES, E. D., BRENN, T. M., and LOTT, J. A., 1990, Appl. Phys. Lett., 56, 1350.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 1350
-
-
Klem, J.F.1
Fu, W.S.2
Gourley, P.L.3
Jones, E.D.4
Brenn, T.M.5
Lott, J.A.6
-
137
-
-
0001368307
-
-
KOHAMA, Y., FUKUDA, Y., and Seki, M., 1988, Appl. Phys. Lett., 52, 380.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 380
-
-
Kohama, Y.1
Fukuda, Y.2
Seki, M.3
-
138
-
-
3643078404
-
-
Institute of Physics Conference Series No. 106 (Bristol: Institute of Physics
-
KONDOW, M., KAKIBAYASHI, H., and MINAGAWA, S., 1990, GaAs and Related Compounds 1990, Institute of Physics Conference Series No. 106 (Bristol: Institute of Physics), p. 1350.
-
(1990)
Gaas and Related Compounds 1990
, pp. 1350
-
-
Kondow, M.1
Kakibayashi, H.2
Minagawa, S.3
-
139
-
-
0342782204
-
-
KOPPENSTEINER, E., HAMBERGER, P., BAUER, G., PESEK, A., KIBBEL, H., PRESTING, H., and Kasper, E., 1993, Appl. Phys. Lett., 62, 1783.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1783
-
-
Koppensteiner, E.1
Hamberger, P.2
Bauer, G.3
Pesek, A.4
Kibbel, H.5
Presting, H.6
Kasper, E.7
-
140
-
-
0024605736
-
-
KROEMER, H., LIU, T. Y., and PETROFF, P. M., 1989, J. Cryst. Growth, 95, 96.
-
(1989)
J. Cryst. Growth
, vol.95
, pp. 96
-
-
Kroemer, H.1
Liu, T.Y.2
Petroff, P.M.3
-
141
-
-
0000344598
-
-
KRISHANMORTHY, V., RIBAS, P., and PARK, R. M., 1991, Appl. Phys. Lett., 58, 2000.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 2000
-
-
Krishanmorthy, V.1
Ribas, P.2
Park, R.M.3
-
142
-
-
3643062706
-
-
KUESTERS, K. H., DE COOMAN, B. C., and CARTER, C. B., 1985, Appl. Phys. Lett., 52, 831.
-
(1985)
Appl. Phys. Lett.
, vol.52
, pp. 831
-
-
Kuesters, K.H.1
De Cooman, B.C.2
Carter, C.B.3
-
143
-
-
0027107453
-
-
KUDLEK, G., PRESSER, N., GUTOWSKI, J., HINGERL, K., ABRAMOF, E., PESEK, A., PAULI, H., and SITTER, H., 1992, J. Cryst. Growth, 117, 290.
-
(1992)
J. Cryst. Growth
, vol.117
, pp. 290
-
-
Kudlek, G.1
Presser, N.2
Gutowski, J.3
Hingerl, K.4
Abramof, E.5
Pesek, A.6
Pauli, H.7
Sitter, H.8
-
144
-
-
0004665852
-
-
Kuo, J. M., FITZGERALD, E. A., XIE, Y. H., and SILVERMAN, P. J., 1993, J. vac. Sei. Technol. B, 11, 857.
-
(1993)
J. Vac. Sei. Technol. B
, vol.11
, pp. 857
-
-
Kuo, J.M.1
Fitzgerald, E.A.2
Xie, Y.H.3
Silverman, P.J.4
-
145
-
-
0039120255
-
-
KURTZ, S. R., BIEFELD, R. M., DAWSON, L. R., FRITZ, I. J., and ZIPPERIAN, T. E., 1988a, Appl. Phys. Lett., 53, 1961.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 1961
-
-
Kurtz, S.R.1
Biefeld, R.M.2
Dawson, L.R.3
Fritz, I.J.4
Zipperian, T.E.5
-
146
-
-
0011913376
-
-
KURTZ, S. R., DAWSON, L. R., ZIPPERIAN, T. E., and LEE, S. R., 1988b, Appl. Phys. Lett., 52, 1581.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 1581
-
-
Kurtz, S.R.1
Dawson, L.R.2
Zipperian, T.E.3
Lee, S.R.4
-
147
-
-
0008655224
-
-
Kurtz, S. R., Osbourn, G. C., Biefeld, R. M., and Lee, S. R., 1988c, Appl. Phys. Lett., 53,216.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 216
-
-
Kurtz, S.R.1
Osbourn, G.C.2
Biefeld, R.M.3
Lee, S.R.4
-
148
-
-
36549094338
-
-
KURTZ, S. R., OSBOURN, G. C., BIEFELD, R. M., DAWSON, L. R., and STEIN, H. J., 1988d, Appl. Phys. Lett., 52, 831.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 831
-
-
Kurtz, S.R.1
Osbourn, G.C.2
Biefeld, R.M.3
Dawson, L.R.4
Stein, H.J.5
-
149
-
-
21144481511
-
-
LAVOIE, C., JOHNSON, S. R., MACKENZIE, J. A., TIEDJE, T., and VAN BUREN, T., 1992, J. vac. Sei. Technol. A, 10, 930.
-
(1992)
J. Vac. Sei. Technol. A
, vol.10
, pp. 930
-
-
Lavoie, C.1
Johnson, S.R.2
Mackenzie, J.A.3
Tiedje, T.4
Van Buren, T.5
-
150
-
-
0027206380
-
-
LAZZARINI, L., NASI, L., NORMAN, C. E., SALVIATI, G., and BERTONI, S., 1993, J. Cryst. Growth, 126, 133.
-
(1993)
J. Cryst. Growth
, vol.126
, pp. 133
-
-
Lazzarini, L.1
Nasi, L.2
Norman, C.E.3
Salviati, G.4
Bertoni, S.5
-
151
-
-
0003116783
-
-
Lee, J. W., SHICHIJO, H., TSAI, H. L., and MATYI, R. J., 1987, Appl. Phys. Lett., 50, 31.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 31
-
-
Lee, J.W.1
Shichijo, H.2
Tsai, H.L.3
Matyi, R.J.4
-
152
-
-
0001958859
-
-
LEFEVBRE, A., HERBEAUX, C., BOUILLET, C., and DIPERSIO, J., 1991B, Phil. Mag. Lett., 63, 23.
-
(1991)
Phil. Mag. Lett.
, vol.63
, pp. 23
-
-
Lefevbre, A.1
Herbeaux, C.2
Bouillet, C.3
Dipersio, J.4
-
153
-
-
0026117021
-
-
LEFEVBRE, A., HERBEAUX, C., and DIPERSIO, J., 1991A, Phil. Mag. A, 63, 471.
-
(1991)
Phil. Mag. A
, vol.63
, pp. 471
-
-
Lefevbre, A.1
Herbeaux, C.2
Dipersio, J.3
-
154
-
-
0343371987
-
-
LEGOUES, F. K., MEYERSON, B. S., and MORAR, J. F., 1991, Phys. Rev. Lett., 66, 2903.
-
(1991)
Phys. Rev. Lett.
, vol.66
, pp. 2903
-
-
Legoues, F.K.1
Meyerson, B.S.2
Morar, J.F.3
-
155
-
-
28444459024
-
-
LeGoues, F. K., Meyerson, B. S., Morar, J. F., and Kirchner, P. D., 1992, J. appl. Phys., 71, 4230.
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 4230
-
-
Legoues, F.K.1
Meyerson, B.S.2
Morar, J.F.3
Kirchner, P.D.4
-
156
-
-
0001024783
-
-
LeGoues, F. K., Mooney, P. M., and Chu, J. O., 1993, Appl. Phys. Lett., 62, 140.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 140
-
-
Legoues, F.K.1
Mooney, P.M.2
Chu, J.O.3
-
157
-
-
3643053193
-
-
LIN, J. F., WU, M. C., JOU, M. J., CHANG, C. M., CHEN, C. Y., and LEE, B. J., 1993, J. appl. Phys., 74, 1781.
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 1781
-
-
Lin, J.F.1
Wu, M.C.2
Jou, M.J.3
Chang, C.M.4
Chen, C.Y.5
Lee, B.J.6
-
158
-
-
0026874382
-
-
LORD, S. M., PEZESHKI, B., and HARRIS, J. S., 1992, Electron. Lett., 28, 1193.
-
(1992)
Electron. Lett.
, vol.28
, pp. 1193
-
-
Lord, S.M.1
Pezeshki, B.2
Harris, J.S.3
-
159
-
-
85024007635
-
-
(to be published)
-
LOURENÇO, M. A., HOMEWOOD, K. P., and CONSIDINE, L., 1994, Mater. Sei. Engng. B (to be published).
-
(1994)
Mater. Sei. Engng. B
-
-
Lourenço, M.A.1
Homewood, K.P.2
Considine, L.3
-
160
-
-
0001506988
-
-
LOVERGINE, N., CINGOLANI, R., LEO, G., MANCINI, A. M., VASANELLI, L., ROMANATO, F., DRIGO, A. V., and MAZZER, M., 1993, Appl. Phys. Lett., 63, 3452.
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 3452
-
-
Lovergine, N.1
Cingolani, R.2
Leo, G.3
Mancini, A.M.4
Vasanelli, L.5
Romanato, F.6
Drigo, A.V.7
Mazzer, M.8
-
161
-
-
3643054303
-
-
LOWE, W., MACHARRIE, R. A., BEAN, J. C., PETICOLAS, L., CLARKE, R., DOSPASSOS, W., BRIZARD, C., and RODRICKS, B., 1991, Phys. Rev. Lett., 67, 2513.
-
(1991)
Phys. Rev. Lett.
, vol.67
, pp. 2513
-
-
Lowe, W.1
Macharrie, R.A.2
Bean, J.C.3
Peticolas, L.4
Clarke, R.5
Dospassos, W.6
Brizard, C.7
Rodricks, B.8
-
162
-
-
0001088605
-
-
LUCAS, N., ZABEL, H., ÜNLÜ, H., and MORKOÇ, H., 1988, Appl. Phys. Lett., 52, 2117.
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 2117
-
-
Lucas, N.1
Zabel, H.2
Ünlü, H.3
Morkoç, H.4
-
163
-
-
85023974877
-
-
(to be published)
-
MACPHERSON, G., BEANLAND, R., GOODHEW, P. J., KIDD, P., SACEDON, A., GONZALEZ, F., GONZALEZ, L., and GONZALEZ, Y., 1994, J. appl. Phys. (to be published).
-
(1994)
J. Appl. Phys
-
-
Macpherson, G.1
Beanland, R.2
Goodhew, P.J.3
Kidd, P.4
Sacedon, A.5
Gonzalez, F.6
Gonzalez, L.7
Gonzalez, Y.8
-
164
-
-
21844497630
-
-
MACPHERSON, P., GOODHEW, P. J., and BEANLAND, R., 1995, Phil. Mag. A, 72, 1531.
-
(1995)
Phil. Mag. A
, pp. 72
-
-
Macpherson, P.1
Goodhew, P.J.2
Beanland, R.3
-
165
-
-
0011753550
-
-
MAHER, D. M., FRASER, H. L., HUMPHREYS, C. J., KNOELL, R. V., and BEAN, J. C., 1987, Appl. Phys. Lett., 50, 574.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 574
-
-
Maher, D.M.1
Fraser, H.L.2
Humphreys, C.J.3
Knoell, R.V.4
Bean, J.C.5
-
166
-
-
3643075301
-
-
MAMASEVIT, H. M., GERGIS, I. S., and JONES, A. B., 1980, Appl. Phys. Lett., 41, 102.
-
(1980)
Appl. Phys. Lett.
, vol.41
, pp. 102
-
-
Mamasevit, H.M.1
Gergis, I.S.2
Jones, A.B.3
-
168
-
-
4143078533
-
-
MATTHEWS, J. W., and BLAKESLEE, A. E., 1974, J. Cryst. Growth, 27, 118; 1975 32, 265.
-
(1974)
J. Cryst. Growth, 27, 118; 1975
, vol.32
, pp. 265
-
-
Matthews, J.W.1
Blakeslee, A.E.2
-
169
-
-
0015301114
-
-
MATTHEWS, J. W., and KLOKHOLM, E., 1972, Mater. Res. Bull., 7, 213.
-
(1972)
Mater. Res. Bull.
, vol.7
, pp. 213
-
-
Matthews, J.W.1
Klokholm, E.2
-
170
-
-
3643127337
-
-
MATTHEWS, J. W., MADER, S., and LIGHT, T. B., 1970, J. appl. Phys., 41, 3700.
-
(1970)
J. Appl. Phys.
, vol.41
, pp. 3700
-
-
Matthews, J.W.1
Mader, S.2
Light, T.B.3
-
171
-
-
0027904556
-
-
MASSELINK, W. T., and ZACHAU, M., 1993, J. Cryst. Growth, 127, 14.
-
(1993)
J. Cryst. Growth
, vol.127
, pp. 14
-
-
Masselink, W.T.1
Zachau, M.2
-
172
-
-
0005376854
-
-
MAZZER, M., CARNERA, A., DRIGO, A. V., and Ferrari, C., 1990, J. appl. Phys., 68, 531.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 531
-
-
Mazzer, M.1
Carnera, A.2
Drigo, A.V.3
Ferrari, C.4
-
173
-
-
0010482336
-
-
MENCZIGER, U., BRUNNER, J., FREISS, E., GAIL, M., ABSTREITER, G., KIBBEL, H., PRESTING, H., and KASPER, E., 1992, Thin Solid Films, 222, 227.
-
(1992)
Thin Solid Films
, vol.222
, pp. 227
-
-
Mencziger, U.1
Brunner, J.2
Freiss, E.3
Gail, M.4
Abstreiter, G.5
Kibbel, H.6
Presting, H.7
Kasper, E.8
-
174
-
-
36549092192
-
-
MEYERSON, B. S., URAM, K. J., and LEGOUES, F. K., 1988, Appl. Phys. Lett., 53, 2555.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2555
-
-
Meyerson, B.S.1
Uram, K.J.2
Legoues, F.K.3
-
175
-
-
0026961909
-
-
MICHEL, J., FITZGERALD, E. A., XIA, Y. H., SILVERMAN, P. J., MORSE, M., and KIMMERLING, L., 1992, J. electron. Mater., 21, 1099.
-
(1992)
J. Electron. Mater.
, vol.21
, pp. 1099
-
-
Michel, J.1
Fitzgerald, E.A.2
Xia, Y.H.3
Silverman, P.J.4
Morse, M.5
Kimmerling, L.6
-
176
-
-
36449003379
-
-
Mil, Y. J., XIE, Y. H., FITZGERALD, E. A., MONROE, D., THIEL, F. A., WEIR, B. E., and FELDMAN, L. C., 1991, Appl. Phys. Lett., 59, 1611.
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 1611
-
-
Mil, Y.J.1
Xie, Y.H.2
Fitzgerald, E.A.3
Monroe, D.4
Thiel, F.A.5
Weir, B.E.6
Feldman, L.C.7
-
177
-
-
85024033051
-
-
MORKOÇ, H., 1991, Vacuum, 42, 257, 1786.
-
(1991)
Vacuum
, vol.42
, Issue.257
, pp. 1786
-
-
Morkoç, H.1
-
178
-
-
85024023670
-
-
MORKOÇ, H., SVERDLOV, B., and GAO, G. B., 1993, Proc. Inst. elec. electron Engrs, 81, 493, 1786.
-
(1993)
Proc. Inst. Elec. Electron Engrs
, vol.81
, Issue.493
, pp. 1786
-
-
Morkoç, H.1
Sverdlov, B.2
Gao, G.B.3
-
179
-
-
0013373614
-
-
MORRISON, I., JAROS, M., and WONG, K. M., 1987, Phys. Rev. B, 36, 9693.
-
(1987)
Phys. Rev. B
, vol.36
, pp. 9693
-
-
Morrison, I.1
Jaros, M.2
Wong, K.M.3
-
180
-
-
3643148130
-
-
MUGGELBERG, C., JAROS, M., and WONG, K. M., 1987, Phys. Rev. B, 36, 9693.
-
(1987)
Phys. Rev. B
, vol.36
, pp. 9693
-
-
Muggelberg, C.1
Jaros, M.2
Wong, K.M.3
-
182
-
-
0026186163
-
-
NISHIMURA, T., KADIOWA, K., MIYASHITA, M., KUMABE, H., and MUROTANI, T., 1991, J. Cryst. Growth, 112, 791.
-
(1991)
J. Cryst. Growth
, vol.112
, pp. 791
-
-
Nishimura, T.1
Kadiowa, K.2
Miyashita, M.3
Kumabe, H.4
Murotani, T.5
-
183
-
-
84956133879
-
-
NISHIMURA, T., MIZUGUCHI, K., HAYAFUJI, N., and MUROTANI, T., 1987, Jap. J. appl. Phys., 26, LI141.
-
(1987)
Jap. J. Appl. Phys
, vol.26
, pp. LI141
-
-
Nishimura, T.1
Mizuguchi, K.2
Hayafuji, N.3
Murotani, T.4
-
184
-
-
0024134831
-
-
NISHIOKA, T., ITOH, Y., SUGO, M., YAMAMOTO, A., and YAMAGUCHI, M., 1988, Jap. J. appl Phys., 21, L2271.
-
(1988)
Jap. J. Appl Phys.
, vol.21
, pp. L2271
-
-
Nishioka, T.1
Itoh, Y.2
Sugo, M.3
Yamamoto, A.4
Yamaguchi, M.5
-
186
-
-
0016496910
-
-
OLSEN, G. H., ABRAHAMS, M. S., BUIOCCHI, C. J., and ZAMEROWSKI, T. J., 1975, J. appl. Phys., 46, 16-43.
-
(1975)
J. Appl. Phys.
, vol.46
, pp. 16-43
-
-
Olsen, G.H.1
Abrahams, M.S.2
Buiocchi, C.J.3
Zamerowski, T.J.4
-
187
-
-
0016559336
-
-
OLSEN, G. H., and SMITH, R. T., 1975, Phys. Stat. sol A, 31, 739.
-
(1975)
Phys. Stat. Sol A
, vol.31
, pp. 739
-
-
Olsen, G.H.1
Smith, R.T.2
-
188
-
-
0000373811
-
-
OLSON, J. M., and KIBBLER, A., 1986, J. Cryst. Growth, 77, 182.
-
(1986)
J. Cryst. Growth
, vol.77
, pp. 182
-
-
Olson, J.M.1
Kibbler, A.2
-
189
-
-
0000014744
-
-
ORDERS, P. J., and USHER, B. F., 1987, Appl. Phys. Lett., 50, 980.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 980
-
-
Orders, P.J.1
Usher, B.F.2
-
190
-
-
21544478296
-
-
ORR, B. G., KESSLER, D., SNYDER, C. W., and SANDER, L., 1992, Europhys. Lett., 19, 33.
-
(1992)
Europhys. Lett.
, vol.19
, pp. 33
-
-
Orr, B.G.1
Kessler, D.2
Snyder, C.W.3
Sander, L.4
-
191
-
-
0020101853
-
-
OSBOURN, G. C., 1982, J. appl. Phys., 53, 1586; 1984, J. vac. Sei. Technol. B, 2, 176; 1985, J. vac. Sei. Technol. A, 3, 826.
-
(1982)
J. Appl. Phys., 53, 1586; 1984, J. Vac. Sei. Technol. B, 2, 176; 1985, J. Vac. Sei. Technol. A
, vol.3
, pp. 826
-
-
Osbourn, G.C.1
-
192
-
-
0000363791
-
-
OSBOURN, G. C., BIEFELD, R. M., and GOURLEY, P. L., 1982, Appl. Phys. Lett., 41, 172.
-
(1982)
Appl. Phys. Lett.
, vol.41
, pp. 172
-
-
Osbourn, G.C.1
Biefeld, R.M.2
Gourley, P.L.3
-
193
-
-
0003957801
-
-
OSBOURN, G. C., GOURLEY, P. L., FRITZ, I. J., BIEFELD, R. M., DAWSON, L. R., and ZIPPERIAN, T. E., 1987, Semicond. Semimetals, 24, 458.
-
(1987)
Semicond. Semimetals
, vol.24
, pp. 458
-
-
Osbourn, G.C.1
Gourley, P.L.2
Fritz, I.J.3
Biefeld, R.M.4
Dawson, L.R.5
Zipperian, T.E.6
-
194
-
-
0026943287
-
-
PASCAL-DELANNOY, F., MASON, N. J., BOUGNOT, G., WALKER, P. J., BOUGNOT, J., GIANI, A., and ALLOGHO, G. G., 1992, J. Cryst. Growth, 124, 409.
-
(1992)
J. Cryst. Growth
, vol.124
, pp. 409
-
-
Pascal-Delannoy, F.1
Mason, N.J.2
Bougnot, G.3
Walker, P.J.4
Bougnot, J.5
Giani, A.6
Allogho, G.G.7
-
196
-
-
0011371178
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
Perovic, D. D., Houghton, D. C., Noël, J. P., and Rowell, N. L., 1993, Microscopy of Semiconducting Materials 1993, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 309.
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 309
-
-
Perovic, D.D.1
Houghton, D.C.2
Noël, J.P.3
Rowell, N.L.4
-
197
-
-
0005231874
-
-
PETROFF, P. M., WEISBUCH, C., DINGLE, R., GOSSARD, A. C., and WIEGMANN, W., 1981, Appl. Phys. Lett., 38, 965.
-
(1981)
Appl. Phys. Lett.
, vol.38
, pp. 965
-
-
Petroff, P.M.1
Weisbuch, C.2
Dingle, R.3
Gossard, A.C.4
Wiegmann, W.5
-
198
-
-
0042617350
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
PIDDUCK, A. J., ROBBINS, D. J., and Cullis, A. G., 1993, Microscopy of Semiconducting Materials 1993, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 609.
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 609
-
-
Pidduck, A.J.1
Robbins, D.J.2
Cullis, A.G.3
-
199
-
-
0024750829
-
-
Pidduck, A. J., Robbins, D. J., Cullis, A. G., Gasson, D. B., and Gasper, J., 1989, J. electrochem. Soc., 136, 3083.
-
(1989)
J. Electrochem. Soc.
, vol.136
, pp. 3083
-
-
Pidduck, A.J.1
Robbins, D.J.2
Cullis, A.G.3
Gasson, D.B.4
Gasper, J.5
-
200
-
-
3643123181
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
Ponce, F. A., Gonzalez, L., Mazuelas, A., and Briones, F., 1993, Microscopy of Semiconducting Materials 1993, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 313.
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 313
-
-
Ponce, F.A.1
Gonzalez, L.2
Mazuelas, A.3
Briones, F.4
-
201
-
-
0002411236
-
-
edited by F. R. N. Nabarro (Amsterdam: North-Holland
-
POND, R. C., 1989, Dislocations in Solids, Vol. 8, edited by F. R. N. Nabarro (Amsterdam: North-Holland), p. 1.
-
(1989)
Dislocations in Solids
, vol.8
, pp. 1
-
-
Pond, R.C.1
-
202
-
-
0006932033
-
-
Presting, H., and Kibbel, H., 1992, Thin Solid Films, 222, 215.
-
(1992)
Thin Solid Films
, vol.222
, pp. 215
-
-
Presting, H.1
Kibbel, H.2
-
203
-
-
0005312426
-
-
RADZIMSKI, Z. J., JIANG, B. L., ROZGONYI, G. A., HUMPHREYS, T. P., HAMAGUCHI, N., and BEDAIR, S. M., 1988, J. appl. Phys., 64, 2328.
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 2328
-
-
Radzimski, Z.J.1
Jiang, B.L.2
Rozgonyi, G.A.3
Humphreys, T.P.4
Hamaguchi, N.5
Bedair, S.M.6
-
204
-
-
0026414649
-
-
Rao, T. S., and Horikoshi, Y., 1991b, J. Cryst. Growth, 115, 328.
-
(1991)
J. Cryst. Growth
, vol.115
, pp. 328
-
-
Rao, T.S.1
Horikoshi, Y.2
-
205
-
-
0343723784
-
-
RAO, T. S., NOZAWA, K., and Horikoshi, Y., 1991b, Jap. J. appl. Phys., 30, L547; 1993, Appl. Phys. Lett., 62, 154.
-
(1991)
Jap. J. Appl. Phys., 30, L547; 1993, Appl. Phys. Lett.
, vol.62
, pp. 154
-
-
Rao, T.S.1
Nozawa, K.2
Horikoshi, Y.3
-
206
-
-
0027649645
-
-
REICHOW, J., GREISCHE, J., HOFFMANN, N., MUGGELBERG, C., ROSSMANN, H., WILDE, L., HENNEBERGER, F., and JACOBS, K., 1993, J. Cryst. Growth, 131, 277.
-
(1993)
J. Cryst. Growth
, vol.131
, pp. 277
-
-
Reichow, J.1
Greische, J.2
Hoffmann, N.3
Muggelberg, C.4
Rossmann, H.5
Wilde, L.6
Henneberger, F.7
Jacobs, K.8
-
207
-
-
0008495568
-
-
Ribas, P., Krishnamoorthy, V., and Park, R. M., 1990, Appl. Phys. Lett., 57, 1040.
-
(1990)
Appl. Phys. Lett.
, vol.57
, pp. 1040
-
-
Ribas, P.1
Krishnamoorthy, V.2
Park, R.M.3
-
208
-
-
84917920550
-
-
Robbins, D. J., Cullis, A. G., and Pidduck, A. J., 1991, J. vac. Sei. Technol. B, 9, 20-48.
-
(1991)
J. Vac. Sei. Technol. B
, vol.9
, pp. 20-48
-
-
Robbins, D.J.1
Cullis, A.G.2
Pidduck, A.J.3
-
209
-
-
0022665077
-
-
ROBBINS, D. J., PIDDUCK, A. J., CULLIS, A. G., CHEW, N. G., HARDEMAN, R. W., GASSON, D. B., PICKERING, C., DAW, A. C., JOHNSON, M., and JONES, R., 1987, J. Cryst. Growth, 81, 421.
-
(1987)
J. Cryst. Growth
, vol.81
, pp. 421
-
-
Robbins, D.J.1
Pidduck, A.J.2
Cullis, A.G.3
Chew, N.G.4
Hardeman, R.W.5
Gasson, D.B.6
Pickering, C.7
Daw, A.C.8
Johnson, M.9
Jones, R.10
-
210
-
-
36449007915
-
-
ROSS, F. M., HULL, R., BAHNCK, D., PETICOLAS, L. J., and KING, C. A., 1993, Appl. Phys. Lett., 62, 1426.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1426
-
-
Ross, F.M.1
Hull, R.2
Bahnck, D.3
Peticolas, L.J.4
King, C.A.5
-
211
-
-
0020781847
-
-
Schaffer, W. J., Lind, M. D., Kowalezyk, S. P., and Grant, R. W., 1983, J. vac. Sei. Technol. B, 1, 688.
-
(1983)
J. Vac. Sei. Technol. B
, vol.1
, pp. 688
-
-
Schaffer, W.J.1
Lind, M.D.2
Kowalezyk, S.P.3
Grant, R.W.4
-
212
-
-
0026820313
-
-
SCHÄFFLER, W. J., TOBBEN, D., HERZOG, H. J., ABSTREITER, G., and HOLLANDER, B., 1992, Semicond. Sei. Technol., 7, 260.
-
(1992)
Semicond. Sei. Technol.
, vol.7
, pp. 260
-
-
Schäffler, W.J.1
Tobben, D.2
Herzog, H.J.3
Abstreiter, G.4
Hollander, B.5
-
215
-
-
0001082658
-
-
Snyder, C. W., Mansfield, J. F., and Orr, B. G., 1992, Phys. Rev. B, 46, 9551.
-
(1992)
Phys. Rev. B
, vol.46
, pp. 9551
-
-
Snyder, C.W.1
Mansfield, J.F.2
Orr, B.G.3
-
216
-
-
21544467378
-
-
Snyder, C. W., Orr, B. G., and Munekta, H., 1993, Appl. Phys. Lett., 62, 46.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 46
-
-
Snyder, C.W.1
Orr, B.G.2
Munekta, H.3
-
217
-
-
0011193064
-
-
SOGA, T., JIMBO, T., and Umeno, M., 1990, Appl. Phys. Lett., 56, 1433.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 1433
-
-
Soga, T.1
Jimbo, T.2
Umeno, M.3
-
218
-
-
0024104016
-
-
SOGA, T., KOHAMA, Y., UCHIDA, K., TAJIMA, M., JIMBO, T., and UMENO, M., 1988, J. Cryst. Growth, 93, 499.
-
(1988)
J. Cryst. Growth
, vol.93
, pp. 499
-
-
Soga, T.1
Kohama, Y.2
Uchida, K.3
Tajima, M.4
Jimbo, T.5
Umeno, M.6
-
219
-
-
0025721197
-
-
SOGA, T., NISHIKAWA, H., JIMBO, T., and UMENO, M., 1991, J. Cryst. Growth, 107, 479.
-
(1991)
J. Cryst. Growth
, vol.107
, pp. 479
-
-
Soga, T.1
Nishikawa, H.2
Jimbo, T.3
Umeno, M.4
-
220
-
-
0021471743
-
-
SPERIOSU, V. S., NICOLET, M. A., PICRAUX, S. T., and BIEFELD, R. M., 1984, Appl. Phys. Lett., 45, 223.
-
(1984)
Appl. Phys. Lett.
, vol.45
, pp. 223
-
-
Speriosu, V.S.1
Nicolet, M.A.2
Picraux, S.T.3
Biefeld, R.M.4
-
222
-
-
0343378964
-
-
edited by E. Kaldis (Amsterdam: North-Holland
-
Stoyanow, B., 1979, Current Topics in Materials Science, Vol. 3, edited by E. Kaldis (Amsterdam: North-Holland), p. 421.
-
(1979)
Current Topics in Materials Science
, vol.3
, pp. 421
-
-
Stoyanow, B.1
-
224
-
-
0018319941
-
-
Strunk, H., Hagen, W., and Bauser, E., 1979, Appl. Phys., 18, 67.
-
(1979)
Appl. Phys.
, vol.18
, pp. 67
-
-
Strunk, H.1
Hagen, W.2
Bauser, E.3
-
225
-
-
0027107538
-
-
SUGIYAMA, I., HOBBS, A., SAITO, T., UEDA, O., SHINOHARA, K., and TAKIGAWA, H., 1992, J. Cryst. Growth, 117, 161.
-
(1992)
J. Cryst. Growth
, vol.117
, pp. 161
-
-
Sugiyama, I.1
Hobbs, A.2
Saito, T.3
Ueda, O.4
Shinohara, K.5
Takigawa, H.6
-
226
-
-
36549092955
-
-
Sugo, M., Takanashi, A., Al-Jassim, M. M., and Yamaguchi, M., 1990, J. appl. Phys., 69, 540.
-
(1990)
J. Appl. Phys.
, vol.69
, pp. 540
-
-
Sugo, M.1
Takanashi, A.2
Al-Jassim, M.M.3
Yamaguchi, M.4
-
227
-
-
85024086422
-
-
Institute of Physics Conference Series No. 104 (Bristol: Institute of Physics), p. 245;1994, Handbook on Semiconductors (Amsterdam: North-Holland) (to be published)
-
Sumino, I., 1989, Structure and Properties of Dislocations in Semiconductors 1989, Institute of Physics Conference Series No. 104 (Bristol: Institute of Physics), p. 245;1994, Handbook on Semiconductors (Amsterdam: North-Holland) (to be published).
-
(1989)
Structure and Properties of Dislocations in Semiconductors 1989
-
-
Sumino, I.1
-
229
-
-
36549099922
-
-
TACHIKAWA, M., and YAMAGUCHI, M., 1990, Appl. Phys. Lett., 56, 484.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 484
-
-
Tachikawa, M.1
Yamaguchi, M.2
-
230
-
-
0025209072
-
-
TABUCHI, M., NODA, S., and SASAKI, A., 1990, J. Cryst. Growth, 99, 315.
-
(1990)
J. Cryst. Growth
, vol.99
, pp. 315
-
-
Tabuchi, M.1
Noda, S.2
Sasaki, A.3
-
231
-
-
0008781844
-
-
TAMURA, M., HASHIMOTO, A., and NAKATSUGAWA, Y., 1992, J. appl. Phys., 72, 3398.
-
(1992)
J. Appl. Phys.
, vol.72
, pp. 3398
-
-
Tamura, M.1
Hashimoto, A.2
Nakatsugawa, Y.3
-
232
-
-
0000707332
-
-
Tatsuoka, H., Kuwuhara, H., Fujiyasu, H., and Nakanishi, Y., 1989, J. appl. Phys., 65, 2073.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2073
-
-
Tatsuoka, H.1
Kuwuhara, H.2
Fujiyasu, H.3
Nakanishi, Y.4
-
233
-
-
85024051799
-
-
TATSUOKA, H., KUWUHARA, H., NAKANISHI, Y., and Fujiyasu, H., 1990, J. appl. Phys., 61, 6860; 1991, Thin Solid Films, 201, 59.
-
(1990)
J. Appl. Phys., 61, 6860; 1991, Thin Solid Films
, vol.201
, pp. 59
-
-
Tatsuoka, H.1
Kuwuhara, H.2
Nakanishi, Y.3
Fujiyasu, H.4
-
236
-
-
0022011232
-
-
TISCHLER, M. A., KATSUYAMA, T., EL-MASRY, N. A., and BEDAIR, S. M., 1985, Appl. Phys. Lett., 46, 294.
-
(1985)
Appl. Phys. Lett.
, vol.46
, pp. 294
-
-
Tischler, M.A.1
Katsuyama, T.2
El-Masry, N.A.3
Bedair, S.M.4
-
237
-
-
84967453829
-
-
TIETJEN, J. J., and AMICK, J. A., 1966, J. electrochem. Soc., 113, 724.
-
(1966)
J. Electrochem. Soc.
, vol.113
, pp. 724
-
-
Tietjen, J.J.1
Amick, J.A.2
-
238
-
-
0042409096
-
-
TSANG, J. C., DACOL, F. H., MOONEY, P. M., Chu, J. O., and MEYERSON, B. S., 1993, Appl. Phys. Lett., 62, 1146.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1146
-
-
Tsang, J.C.1
Dacol, F.H.2
Mooney, P.M.3
Chu, J.O.4
Meyerson, B.S.5
-
239
-
-
3643092908
-
-
TSAO, J. Y., DODSON, B. W., PICRAUX, S. T., and CORNELISON, D. M., 1987, Phys. Rev. Lett., 59, 2681.
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 2681
-
-
Tsao, J.Y.1
Dodson, B.W.2
Picraux, S.T.3
Cornelison, D.M.4
-
240
-
-
85024053156
-
-
Materials Research Society Symposium Proceedings, Vol. 220 (Pittsburgh, Pennsylvania: Materials Research Society
-
TUPPEN, C. G., and GIBBINGS, C. J., 1990, J. Cryst. Growth, 94, 392; 1991, Materials Research Society Symposium Proceedings, Vol. 220 (Pittsburgh, Pennsylvania: Materials Research Society), p. 187.
-
(1990)
J. Cryst. Growth, 94, 392; 1991
, pp. 187
-
-
Tuppen, C.G.1
Gibbings, C.J.2
-
241
-
-
36549103442
-
-
TUPPEN, C. G., GIBBINGS, C. J., and HOCKLY, M., 1989, J. appl. Phys., 68, 1526.
-
(1989)
J. Appl. Phys.
, vol.68
, pp. 1526
-
-
Tuppen, C.G.1
Gibbings, C.J.2
Hockly, M.3
-
242
-
-
36549091512
-
-
VAN DER MERWE, J. H., and JESSER, W. A., 1988, J. appl. Phys., 63, 1509.
-
(1988)
J. Appl. Phys.
, vol.63
, pp. 1509
-
-
Van Der Merwe, J.H.1
Jesser, W.A.2
-
243
-
-
0027259535
-
-
VANHELLEMONT, J., DE WOLF, I., JANSSENS, K. G. F., FRABBONI, S., BALBONI, R., and ARMIGLIATO, A., 1993, Appl. Surf. Sei., 63, 119.
-
(1993)
Appl. Surf. Sei.
, vol.63
, pp. 119
-
-
Vanhellemont, J.1
De Wolf, I.2
Janssens, K.G.F.3
Frabboni, S.4
Balboni, R.5
Armigliato, A.6
-
244
-
-
3643075303
-
-
Res. Soc. Symp. Proc., Vol. 116, edited by H. K. Choi, R. Hull, H. Ishiwara and R. J. Nemanich (Pittsburgh, Pennsylvania: Materials Research Society
-
VARRIO, J., SALOKATVE, A., ASONEN, H., HOVINEN, M., PESSA, M., ISHIDA, K., and KITAJIMA, H., 1986, Heteroepitaxy on Silicon: Fundamentals, Structures and Devices, Mater. Res. Soc. Symp. Proc., Vol. 116, edited by H. K. Choi, R. Hull, H. Ishiwara and R. J. Nemanich (Pittsburgh, Pennsylvania: Materials Research Society), p. 91.
-
(1986)
Heteroepitaxy on Silicon: Fundamentals, Structures and Devices, Mater
, pp. 91
-
-
Varrio, J.1
Salokatve, A.2
Asonen, H.3
Hovinen, M.4
Pessa, M.5
Ishida, K.6
Kitajima, H.7
-
245
-
-
3643104453
-
-
edited by J. W. Matthews (New York: Academic Press
-
VENABLES, J. A., and PRICE, G. L., 1975, Epitaxial Growth, edited by J. W. Matthews (New York: Academic Press), p. 77.
-
(1975)
Epitaxial Growth
, pp. 77
-
-
Venables, J.A.1
Price, G.L.2
-
247
-
-
0024053895
-
-
WANG, G. W., CHEN, Y. K., SCHAFF, W. J., and EASTMAN, L. F., 1988, IEEE Trans. Electron Devices, 35, 818.
-
(1988)
IEEE Trans. Electron Devices
, vol.35
, pp. 818
-
-
Wang, G.W.1
Chen, Y.K.2
Schaff, W.J.3
Eastman, L.F.4
-
248
-
-
0024103877
-
-
WATANABE, Y., KADOTA, Y., KADOTA, H., OKAMOTO, H., SEKI, M., and OHMACHI, Y., 1988, J. Cryst. Growth, 93, 459.
-
(1988)
J. Cryst. Growth
, vol.93
, pp. 459
-
-
Watanabe, Y.1
Kadota, Y.2
Kadota, H.3
Okamoto, H.4
Seki, M.5
Ohmachi, Y.6
-
249
-
-
0042660346
-
-
WATSON, G. P., FITZGERALD, E. A., XIE, Y. H., and MONROE, D., 1994, J. appl. Phys., 75, 263.
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 263
-
-
Watson, G.P.1
Fitzgerald, E.A.2
Xie, Y.H.3
Monroe, D.4
-
250
-
-
0001157567
-
-
WEBER, J., and ALONSO, M. I., 1989, Phys. Rev. B, 40, 5683.
-
(1989)
Phys. Rev. B
, vol.40
, pp. 5683
-
-
Weber, J.1
Alonso, M.I.2
-
252
-
-
0011153619
-
-
WHELAN, J. S., GEORGE, T., WEBER, E. R., NOZAKI, S., Wu, A. T., and UMENO, M., 1990, J. appl. Phys., 68, 5115.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 5115
-
-
Whelan, J.S.1
George, T.2
Weber, E.R.3
Nozaki, S.4
Wu, A.T.5
Umeno, M.6
-
253
-
-
0001443922
-
-
WHITEHOUSE, C. R., BARNETT, S. J., SOLEY, D. E. J., QUARRELL, J., ALDRIDGE, S. J., CULLIS, A. G., EMENY, M. T., and JOHNSON, A. D., 1992, Rev. scient. Instrum., 63, 634.
-
(1992)
Rev. Scient. Instrum.
, vol.63
, pp. 634
-
-
Whitehouse, C.R.1
Barnett, S.J.2
Soley, D.E.J.3
Quarrell, J.4
Aldridge, S.J.5
Cullis, A.G.6
Emeny, M.T.7
Johnson, A.D.8
-
254
-
-
3643073142
-
-
Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics
-
WHITEHOUSE, C. R., BARNETT, S. J., USHER, B. F., CULLIS, A. G., KEIR, A. M., JOHNSON, A. D., CLARK, G. F., TANNER, B. K., SPIRKL, W., LUNN, B., HAGSTON, W. E., and HOGG, J. C. H., 1993, Microscopy of Semiconducting Materials 1993, Institute of Physics Conference Series No. 134 (Bristol: Institute of Physics), p. 563.
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 563
-
-
Whitehouse Barnett, C.R.S.J.1
Usher, B.F.2
Cullis, A.G.3
Keir, A.M.4
Johnson, A.D.5
Tanner, B.K.6
Spirkl, W.7
Lunn, B.8
Hagston, W.E.9
Hogg, J.C.H.10
-
255
-
-
0002080670
-
-
WILLIS, J. R., JAIN, S. C., and BULLOUGH, R., 1990, Phil. Mag. A, 62, 115; 1991, Appl. Phys. Lett., 59, 920.
-
(1990)
Phil. Mag. A, 62, 115; 1991, Appl. Phys. Lett.
, vol.59
, pp. 920
-
-
Willis, J.R.1
Jain, S.C.2
Bullough, R.3
-
256
-
-
0347811031
-
-
WON, T., AGARWALA, S., and MARKOÇ, H., 1988, Appl. Phys. Lett., 53, 2311.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2311
-
-
Won, T.1
Agarwala, S.2
Markoç, H.3
-
257
-
-
3643121091
-
-
(Pittsburgh, Pennsylvania: Materials Research Society
-
XIE, Y. H., FITZGERALD, E. A., Mu, Y. J., MONROE, D., THIEL, F. A., WIER, B. E., and FELDMAN, L. C., 1991, Materials Research Society Symposium Proceedings Vol. 220 (Pittsburgh, Pennsylvania: Materials Research Society), p. 413.
-
(1991)
Materials Research Society Symposium Proceedings Vol. 220
, pp. 413
-
-
Xie, Y.H.1
Fitzgerald, E.A.2
Mu, Y.J.3
Monroe, D.4
Thiel, F.A.5
Wier, B.E.6
Feldman, L.C.7
-
258
-
-
0026908837
-
-
XIE, Y. H., FITZGERALD, E. A., SILVERMAN, P. J., KORTAN, A. R., and WIER, B. E., 1992, Mater. Sei. Engng, B14, 332.
-
(1992)
Mater. Sei. Engng
, vol.B14
, pp. 332
-
-
Xie, Y.H.1
Fitzgerald, E.A.2
Silverman, P.J.3
Kortan, A.R.4
Wier, B.E.5
-
259
-
-
21544433387
-
-
YAMAGUCHI, M., NISHIOKA, T., and SUGO, M., 1989a, Appl. Phys. Lett., 54, 24.
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 24
-
-
Yamaguchi, M.1
Nishioka, T.2
Sugo, M.3
-
260
-
-
0006215566
-
-
YAMAGUCHI, M., SUGO, M., and Itoh, Y., 1989b, Appl. Phys. Lett., 54, 2568.
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 2568
-
-
Yamaguchi, M.1
Sugo, M.2
Itoh, Y.3
-
261
-
-
33845763354
-
-
YAMAGUCHI, M., TACHIKAWA, M., SUGO, M., KONDO, S., and ITOH, Y., 1990, Appl. Phys. Lett., 56, 27.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 27
-
-
Yamaguchi, M.1
Tachikawa, M.2
Sugo, M.3
Kondo, S.4
Itoh, Y.5
-
262
-
-
85176524243
-
-
62, 1212; 1989
-
YONENAGA, I., and SUMINO, K., 1987, J. appl. Phys., 62, 1212; 1989, 65, 85.
-
(1987)
J. Appl. Phys.
, Issue.65
, pp. 85
-
-
Yonenaga, I.1
Sumino, K.2
-
264
-
-
0027646170
-
-
ZHOU, G. L., and MORKOÇ, H., 1993, Thin Solid Films, 231, 125.
-
(1993)
Thin Solid Films
, vol.231
, pp. 125
-
-
Zhou, G.L.1
Morkoç, H.2
-
265
-
-
0000654250
-
-
ZHU, J. G., and CARTER, C. B., 1990, Phil. Mag. A, 62, 319.
-
(1990)
Phil. Mag. A
, vol.62
, pp. 319
-
-
Zhu, J.G.1
Carter, C.B.2
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