Combined X-ray-electron imaging techniques: Limitations on lateral resolution

Journal of Electron Spectroscopy and Related Phenomena

Volumn 151, Issue 2, 2006, Pages 97-104

  Bakaleynikov, L A ^a   Flegontova, E Yu ^a   Zolotoyabko, E ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Monte Carlo simulations; Secondary electron emission; X ray conversion; X ray imaging

Indexed keywords

COMPUTER SIMULATION; ELECTRON MICROSCOPY; MONTE CARLO METHODS; SECONDARY EMISSION; X RAY MICROSCOPES; X RAYS;

ELECTRON SHELLS; X-RAY CONVERSION; X-RAY IMAGING;

IMAGING TECHNIQUES;

EID: 33244488980     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.10.007     Document Type: Article

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