High-resolution lenses for sub-100 nm x-ray fluorescence microscopy

Applied Physics Letters

Volumn 77, Issue 23, 2000, Pages 3851-3853

  David, C ^a   Kaulich, B ^b   Barrett, R ^b   Salome M ^b   Susini, J ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001500788     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1329638     Document Type: Article

References (13)

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