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Volumn 71, Issue 18, 1997, Pages 2557-2559

Phase contrast hard x-ray microscopy with submicron resolution

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRICAL OPTICS; GOLD; NYLON POLYMERS; PHOTONS; WAVEGUIDES;

EID: 0031551596     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119324     Document Type: Article
Times cited : (88)

References (17)
  • 10
    • 0003203383 scopus 로고    scopus 로고
    • X-ray microtomography using interferometric phase-contrast
    • edited by J. Thieme, G. Schmahl, E. Umbach, and D. Rudolph Springer-Verlag, Heidelberg
    • U. Bonse, F. Beckmann, F. Busch, and O. Guennewig, "X-ray microtomography using interferometric phase-contrast," in X-Ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, E. Umbach, and D. Rudolph (Springer-Verlag, Heidelberg, 1996).
    • (1996) X-Ray Microscopy and Spectromicroscopy
    • Bonse, U.1    Beckmann, F.2    Busch, F.3    Guennewig, O.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.