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Volumn 78, Issue 1, 2001, Pages 132-134
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X-ray phase-contrast imaging with submicron resolution by using extremely asymmetric Bragg diffractions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005732698
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1337621 Document Type: Article |
Times cited : (23)
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References (10)
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