Imaging of ferroelectric thin films by X-ray photoemission electron microscopy (XPEEM)

Ultramicroscopy

Volumn 104, Issue 3-4, 2005, Pages 169-175

  Lev, U ^a   Heun, S ^b,c   Locatelli, A ^b   Zolotoyabko, E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b SINCROTRONE TRIESTE   (Italy)

^c LABORATORIO TASC   (Italy)

Author keywords

Ferroelectrics; Insulators; LEEM; PEEM

Indexed keywords

ELECTRODES; FERROELECTRIC MATERIALS; GRANULAR MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

GRANULAR STRUCTURE; LOW-ENERGY PHOTOELECTRONS; NANOSPECTROSCOPY BEAMLINE; X-RAY PHOTOEMISSION ELECTRON MICROSCOPY (XPEEM);

THIN FILMS;

FERROUS ION; GOLD;

ARTICLE; COATED PARTICLE; ELECTRIC ACTIVITY; IMAGE ANALYSIS; IMAGE QUALITY; LOW ENERGY RADIATION; MATERIAL COATING; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SYNCHROTRON RADIATION; X RAY FILM; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 22144438386     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.03.008     Document Type: Article

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