A transmission x-ray microscope based on secondary-electron imaging

Review of Scientific Instruments

Volumn 68, Issue 9, 1997, Pages 3464-3476

  Watts, R N ^a   Liang, S ^a   Levine, Z H ^a   Lucatorto, T B ^a   Polack, F ^b   Scheinfein, M R ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CAMERAS; CHARGE COUPLED DEVICES; ELECTRONS; IMAGING TECHNIQUES; LAPLACE TRANSFORMS; LENSES; PHOSPHORS; PHOTOCATHODES;

PHOTOELECTRON EMISSION MICROSCOPE; SCANNING PHOTOELECTRON MICROSCOPE; TRANSMISSION X RAY MICROSCOPE; X RAY OPTICAL SYSTEMS;

X RAY MICROSCOPES;

EID: 0031233178     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148309     Document Type: Article

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