Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2319-2325

  Baggio, J ^a,b   Ferlet Cavrois, V ^a,b   Lambert, D ^a,b   Paillet, P ^a,b   Wrobel, F ^c   Hirose, K ^d   Saito, H ^d   Blackmore, E W ^a,e  

^a IEEE   (France)

^b CEA DIF   (France)

^c UNIVERSITÉ CÔTE D'AZUR   (France)

^d JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^e TRIUMF   (Canada)

Author keywords

Neutron; Proton; SEU; SOI; SRAM

Indexed keywords

DECA-NANOMETRIC TECHNOLOGIES; GATE LENGTHS; SEU; TERRESTRIAL RADIATIVE ENVIRONMENT;

COMPUTER SIMULATION; EXTRAPOLATION; MONTE CARLO METHODS; NEUTRON IRRADIATION; PROTONS; SILICON ON INSULATOR TECHNOLOGY;

STATIC RANDOM ACCESS STORAGE;

EID: 33144476661     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860722     Document Type: Conference Paper

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