Parameterization of neutron-induced ser in bulk SRAMs from reverse Monte Carlo simulations

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2313-2318

  Wrobel, Frédéric ^a   Iacconi, Philibert ^a  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

Monte Carlo method; Neutron; Nuclear reactions; Reverse Monte Carlo method; Single event upset; Soft error rate

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; ERROR ANALYSIS; FAILURE ANALYSIS; MONTE CARLO METHODS; NEUTRONS; NUCLEAR ENGINEERING; PARAMETER ESTIMATION;

CALCULATION TIMES; RPP APPROXIMATION; SEU CROSS SECTION; SOFT ERROR RATE;

STATIC RANDOM ACCESS STORAGE;

EID: 33144488803     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860751     Document Type: Conference Paper

References (19)

1. J. F. Ziegler and W. A. Lanford, "Effect of cosmic rays on computer memories," Science, vol. 206, pp. 776-788, 1979.
2. 2 in neutron-induced SEU in SRAMs," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2055-2059, Dec. 2003.
3. D. Lambert, J. Baggio, V. Ferlet-Cavrois, O. Flament, F. Saigné, B. Sagnes, N. Buard, and T. Carrière, "Neutron-Induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3435-3441, Dec. 2004.
4. G. Gasiot, V. Ferlet-Cavrois, J. Baggio, P. Roche, P. Flatresse, A. Guyot, P. Morel, O. Bersillon, and J. du Port de Pontcharra, "SEU sensitivity of bulk and SOI technologies to 14-MeV neutrons," IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 3032-3037, Dec. 2002.
5. L. W. Connell, F. W. Sexton, and A. K. Prinja, "Further development of the heavy ion cross section for single event UPset: Model (HICUP)," IEEE Trans. Nucl. Sci., vol. 42, no. 6, pp. 2026-2034, Dec. 1995.
6. F. Wrobel, J.-M. Palau, P. Iacconi, M.-C. Palau, B. Sagnes, and F. Saigné, "Methodology to compute neutron induced alphas contribution on the SEU cross section in sensitive RAMs," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3291-3297, Dec. 2004.
7. J. Raynal, "Notes on ECIS 95," CEA, Arlington, VA, Saclay Rep. CEA-N-2772, 1994.
8. Reference Input Parameter Library (1998). Handbook for calculations of nuclear reaction data. [Online]. Available: http://wwwnds.iaea.or.at/ripl/
9. A. Koning and J.-P. Delaroche, "Local and global nucleon optical models from 1 keV to 200 MeV," Nucl. Phys. A, vol. A713, pp. 231-310, 2003.
10. F. Wrobel, J. M. Palau, M. C. Calvet, O. Bersillon, and H. Duarte, "Incidence of multi-particles events on soft error rates caused by n-Si nuclear reactions," IEEE Trans. Nucl. Sci., vol. 47, no. 6, pp. 2580-2585, Dec. 2000.
11. J.F.Ziegler. (1996) TRIM96. The Transport of Ions in Matter. [Online]. Available: http://www.srim.org/
12. E. H. Cannon, D. D. Reinhardt, M. S. Gordon, and P. S. Makowenskij, "SRAM SER in 90, 130, and 180 nm bulk and SOI technologies," in Proc. 42nd Annu. 2004 IEEE Int. Reliability Physics Symp., pp. 300-304.
13. W. N. Hess, E. H. Canfield, and R. E. Lingenfelter, "Cosmic-ray neutron demography," J. Geophys. Res., vol. 66, pp. 665-677, Mar. 1961.
14. J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of proton/neutron SEU sensitivity of commercial SRAMs - Application to the terrestrial environment test method," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3420-3426, Dec. 2004.
15. P. Roche, G. Gasiot, K. Forbes, V. O'Sullivan, and V. Ferlet, "Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm tecnology node," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2046-2054, Dec. 2003.
16. C. S. Dyer, S. N. Clucas, C. Sanderson, A. D. Frydland, and R. T. Green, "An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV," IEEE Trans. Nucl. Sci., vol. 51, no. 5, pp. 2817-2824, Oct. 2004.
17. T. Granlund, B. Granbom, and N. Olsson, "Soft error rate increase for new generations of SRAMs," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2065-2068, Dec. 2003.
18. G. Hubert, K. Coulie, J. M. Palau, B. Sagnes, M. C. Calvet, and S. Fourtine, "SEU sensitivity of SRAMs to neutron- or proton-induced secondary fragments," in Proc. Nuclear and Space Radiation Effects Conf., Reno, NV, 2000, pp. -〈AUTHOR: PAGE RANGE?〉.
19. K. Castellani-Coulié, J.-M. Palau, G. Hubert, M.-C. Calvet, P. E. Dodd, and F. Sexton, "Various SEU conditions in SRAM studied by 3-D device simulation," IEEE Trans. Nucl. Sci., vol. 48, no. 6, pp. 1931-1936, Dec. 2001.