Sensitivity-enhanced atomic force acoustic microscopy with concentrated-mass cantilevers

Nanotechnology

Volumn 16, Issue 4, 2005, Pages 542-550

  Muraoka, Mikio ^a  

^a AKITA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; DUCTILITY; ELASTIC MODULI; ELASTICITY; IMAGE ANALYSIS; NATURAL FREQUENCIES; SENSORS; THIN FILMS;

ADHESION FORCES; ATOMIC FORCE ACOUSTIC MICROSCOPY (AFAM); CONTACT FORCE; SLIP BANDS;

CANTILEVER BEAMS;

EID: 24144458892     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/4/035     Document Type: Article

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