Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3458-3462

  De Marzi, G ^a   Lacopino, D ^a   Quinn, A J ^a   Redmond, G ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURVE FITTING; ELECTRIC CONDUCTIVITY; ELECTRODEPOSITION; GRAIN BOUNDARIES; ION BEAMS; LITHOGRAPHY; MATHEMATICAL MODELS; MICROELECTRODES; OHMIC CONTACTS; PHONONS; PLATINUM; SCANNING ELECTRON MICROSCOPY; SUPERLATTICES; TRANSPORT PROPERTIES; ULTRATHIN FILMS;

FOCUSED ION BEAM (FIB); GRAIN-BOUNDARY SCATTERING; METALLIC NANOWIRES; TEMPERATURE DEPENDENCE;

NANOSTRUCTURED MATERIALS;

EID: 4944233707     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1779972     Document Type: Article

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