메뉴 건너뛰기




Volumn 22, Issue 3, 2004, Pages 452-460

Forced convection magnetoelectroplating for enhanced semiconductor metallization

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CAPACITANCE; COPPER; ELECTRODEPOSITION; ELECTROLYSIS; ELECTROLYTES; ELECTROPLATING; INTEGRATED CIRCUITS; LARGE SCALE SYSTEMS; MAGNETIC FIELDS; METALLIZING; PERMITTIVITY; SKIN EFFECT;

EID: 3142512685     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1666881     Document Type: Article
Times cited : (2)

References (47)
  • 2
    • 33747557398 scopus 로고    scopus 로고
    • R. H. Havemann and J. A. Hutchby, Proc. IEEE 89, 586 (2001); P. C. Andricacos, C. Uzoh, J. O. Dukovic, J. Horkans, and H. Delibianni, IBM J. Res. Dev. 42, 567 (1998).
    • (2001) Proc. IEEE , vol.89 , pp. 586
    • Havemann, R.H.1    Hutchby, J.A.2
  • 17
    • 3142612579 scopus 로고
    • U.S. Patent No. 4,968,390 November 6
    • A. J. Bard, O. E. Huesser, and D. H. Craston, U.S. Patent No. 4,968,390 (November 6, 1990).
    • (1990)
    • Bard, A.J.1    Huesser, O.E.2    Craston, D.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.