Role of surface texturization in the formation of highly luminescent, stable and thick porous silicon films

Materials Science and Engineering: B

Volumn 127, Issue 2-3, 2006, Pages 255-260

  Sharma, Shailesh N ^a   Bhagavannarayana, G ^a   Sharma, R K ^a   Lakshmikumar, S T ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

Photoluminescence; Polished substrate; Porous silicon; Surface morphology; Textured substrate

Indexed keywords

ANODIC OXIDATION; CURRENT DENSITY; ENERGY GAP; MORPHOLOGY; PHOTOLUMINESCENCE; POROSITY; POROUS SILICON; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TEXTURES; X RAY ANALYSIS;

HIGH-RESOLUTION X-RAY DIFFRACTOMETRY (HRXRD); POLISHED SUBSTRATES; TEXTURED SUBSTRATES; TEXTURIZATION;

THICK FILMS;

EID: 31144448351     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.10.001     Document Type: Article

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