Morphological, optical and electrical characterization of antireflective porous silicon coatings for solar cells

Optical Materials

Volumn 17, Issue 1-2, 2001, Pages 75-78

  Martin Palma R J ^a,b   Vazquez L ^b   Herrero, P ^b   Martinez Duart J M ^a,b   Schnell, M ^c   Schaefer, S ^c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

AFM; Optical behavior; Porous silicon; Solar cells

Indexed keywords

ANTIREFLECTION COATINGS; ATOMIC FORCE MICROSCOPY; ETCHING; GRAIN SIZE AND SHAPE; LIGHT EMISSION; MORPHOLOGY; OPTICAL FILMS; POLYCRYSTALLINE MATERIALS; POROUS SILICON; SCANNING ELECTRON MICROSCOPY;

METALLIC CONTACTS;

SILICON SOLAR CELLS;

EID: 0035360464     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(01)00022-2     Document Type: Conference Paper

References (6)