Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers

Microelectronics Reliability

Volumn 46, Issue 2-4, 2006, Pages 201-212

  Naseh, Sasan ^a   Deen, M Jamal ^a   Chen, Chih Hung ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC AMPLIFIERS; MICROELECTRONICS; TRANSISTORS;

HOT-CARRIER STRESS (HCS); LOW NOISE AMPLIFIER (LNA); LOW NOISE AMPLIFIERS; NMOSFET;

ACOUSTIC NOISE;

EID: 30844465047     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.04.009     Document Type: Article

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