Effects of electrical stress on the frequency performance of 0.18 μm technology NMOSFETs

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2001, Pages 119-123

  Naseh, S ^a   Deen, M J ^a   Marinov, O ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRIC NETWORK ANALYZERS; ELECTRIC VARIABLES MEASUREMENT; GATES (TRANSISTOR); HOT CARRIERS; IMPACT IONIZATION; SCATTERING PARAMETERS; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

BIAS CURRENTS; ELECTRICAL STRESS; SEMICONDUCTOR PARAMETER ANALYSER;

MOSFET DEVICES;

EID: 0034865467     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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