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Volumn 287, Issue 1, 2006, Pages 94-100

Impurity effects in ZnO and nitrogen-doped ZnO thin films fabricated by MOCVD

Author keywords

A1. Impurities; A3. Doping chemical vapor deposition processes; B1. Oxide; B2. Semiconducting II VI materials

Indexed keywords

CARRIER CONCENTRATION; DOPING (ADDITIVES); IMPURITIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITROGEN; NITROGEN OXIDES; PASSIVATION; THIN FILMS;

EID: 29944446781     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.10.050     Document Type: Article
Times cited : (64)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.