p-type ZnO thin films formed by CVD reaction of diethylzinc and NO gas

Electrochemical and Solid-State Letters

Volumn 6, Issue 4, 2003, Pages

  Li, X ^a   Yan, Y ^a   Gessert, T A ^a   DeHart, C ^a   Perkins, C L ^a   Young, D ^a   Coutts, T J ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARRIER CONCENTRATION; CRYSTAL STRUCTURE; DOPING (ADDITIVES); METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITROGEN OXIDES; SEEBECK EFFECT; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

CRYSTAL PROPERTIES;

THIN FILMS;

EID: 0037380835     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1554292     Document Type: Article

References (9)

1. S. B. Zhang, S.-H. Wei, and A. Zunger, J. Appl. Phys., 83, 3192 (1998).
2. M. Joseph, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2, 38, L1205 (1999).
3. K. Minegishi, Y. Koiwai, Y. KiKuchi, K. Yano, M. Kasuga, and A. Shimizu, Jpn. J. Appl. Phys., Part 2, 36, L1453 (1997).
4. X. Guo, H. Tabata, and T. Kawai, J. Cryst. Growth, 223, 135 (2001).
5. D. C. Look, D. C. Reynolds, C. W. Litton, R. L. Jones, D. B, Eason, and G. Cantwell, Appl. Phys. Lett., 81, 1830 (2002).
6. Y. Yan and S. B. Zhang, Phys. Rev. Lett., 86, 5723 (2001).
7. Handbook of Auger Electron Spectroscopy, 3rd ed., Carol L. Hedberg, Editor, Physical Electronics, Inc., Eden Prairie, MN (1995).
8. T. Yamamoto and H. K. Yoshida, Mater. Res. Soc. Symp. Proc., 623, 223 (2000).
9. N. Y. Garces, N. C. Giles, L. E. Halliburton, G. Cantwell, D. B. Eason, D. C. Reynolds, and D. C. Look, Appl. Phys. Lett., 80, 1334 (2002).