Identification of nitrogen chemical states in N-doped ZnO via x-ray photoelectron spectroscopy

Journal of Applied Physics

Volumn 97, Issue 3, 2005, Pages

  Perkins, Craig L ^a   Lee, Se Hee ^a   Li, Xiaonan ^a   Asher, Sally E ^a   Coutts, Timothy J ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STATES; CONDUCTION BAND; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS); VALANCE BAND SPECTRA;

AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; FERMI LEVEL; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR DEVICES; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

NITROGEN;

EID: 13644280048     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1847728     Document Type: Article

References (41)

1. P. A. Sundqvist, Q. X. Zhao, and M. Willander, Phys. Rev. B 68, 155334 (2003).
2. Y. Segawa, A. Ohtomo, M. Kawasaki, H. Koinuma, Z. K. Tang, P. Yu, and G. K. L. Wong, Phys. Status Solidi B 202, 669 (1997).
3. S. J. Chang, Y. K. Su, and Y. P. Shei, J. Vac. Sci. Technol. A 13, 385 (1995).
4. P. Sharma and K. Sreenivas, Appl. Phys. Lett. 83, 3617 (2003).
5. W. I. Park, S. J. An, G. C. Yi, and H. M. Jang, J. Mater. Res. 16, 1358 (2001).
6. S. K. Hong, T. Hanada, H. J. Ko, Y. F. Chen, T. Yao, D. Imai, K. Araki, M. Shinohara, K. Saitoh, and M. Terauchi, Phys. Rev. B 65, 115331 (2002).
7. Z. L. Wang, Mater. Today 7, 26 (2004).
8. V. E. Henrich and P. A. Cox, The Surface Science of Metal Oxides (Cambridge University Press, Cambridge, 1994).
9. Y. F. Yan, S. B. Zhang, and S. T. Pantelides, Phys. Rev. Lett. 86, 5723 (2001).
10. J. Z. Wang, G. T. Du, B. J. Zhao, X. T. Yang, Y. T. Zhang, Y. Ma, D. L. Liu, Y. C. Chang, H. S. Wang, H. J. Yang, and S. R. Yang, J. Cryst. Growth 255, 293 (2003).
11. T. Ohshima, T. Ikegami, K. Ebihara, J. Asmussen, and R. Thareja, Thin Solid Films 435, 49 (2003).
12. H. Maki, N. Ichinose, I. Sakaguchi, N. Ohashi, H. Haneda, and J. Tanaka, Electroceramics Jpn. Iv 216, 61 (2002).
13. H. Maki, I. Sakaguchi, N. Ohashi, S. Sekiguchi, H. Haneda, J. Tanaka, and N. Ichinose, Jpn. J. Appl. Phys., Part 1, Part 1 42, 75 (2003).
14. J. M. Bian, X. M. Li, X. D. Gao, W. D. Yu, and L. D. Chen, Appl. Phys. Lett. 84, 541 (2004).
15. X. Li, Y. Yan, T. A. Gessert, C. DeHart, C. L. Perkins, D. Young, and T. J. Coutts, Electrochem. Solid-State Lett. 6, C56 (2003).
16. X. Li, Y. Yan, T. A. Gessert, C. L. Perkins, D. Young, C. DeHart, M. Young, and T. J. Coutts, J. Vac. Sci. Technol. A 21, 1342 (2003).
17. F. Boccuzzi and E. Guglielminotti, Surf. Sci. 271, 149 (1992).
18. W. E. Carlos, E. R. Glaser, and D. C. Look, Physica B 308, 976 (2001).
19. N. Y. Garces, L. J. Wang, N. C. Giles, L. E. Halliburton, G. Cantwell, and D. B. Eason, J. Appl. Phys. 94, 519 (2003).
20. D. C. Look, R. L. Jones, J. R. Sizelove, N. Y. Garces, N. C. Giles, and L. E. Halliburton, Phys. Status Solidi A 195, 171 (2003).
21. N. Y. Garces, N. C. Giles, L. E. Halliburton, G. Cantwell, D. B. Eason, D. C. Reynolds, and D. C. Look, Appl. Phys. Lett. 80, 1334 (2002).
22. G. A. Somorjai, Chemistry in Two Dimensions, 5th ed. (Wiley Interscience, Ithaca, 1990).
23. G. Teeter, C. L. Perkins, S. E. Asher, M. Young, and P. Sheldon (unpublished).
24. C. J. Powell, Surf. Interface Anal. 23, 121 (1995).
25. V. 4.0.4 ed. (Wavemetrics Inc., Lake Oswego, OR).
26. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Eden Prairie, 1992).
27. J. C. Fuggle and D. Menzel, Surf. Sci. 79, 1 (1979).
28. J. Torres, C. C. Perry, S. J. Bransfield, and A. H. Fairbrother, J. Phys. Chem. B 107, 5558 (2003).
29. H. K. Sanghera and J. L. Sullivan, Surf. Interface Anal. 27, 678 (1999).
30. A. Nilsson, O. Bjorneholm, H. Tillborg, B. Hernnas, R. J. Guest, A. Sandell, R. E. Palmer, and N. Martensson, Surf. Sci. 287, 758 (1993).
31. J. A. Taylor, G. M. Lancaster, and J. W. Rabalais, J. Electron Spectrosc. Relat. Phenom. 13, 435 (1978).
32. E. C. Lee, Y. S. Kim, Y. G. Jin, and K. J. Chang, Physica B 308, 912 (2001).
33. E. C. Lee, Y. S. Kim, Y. G. Jin, and K. J. Chang, Phys. Rev. B 64, 085120 (2001).
34. K. Ozawa and K. Edamoto, Surf. Rev. Lett. 9, 717 (2002).
35. K. Ozawa, T. Hasegawa, K. Edamoto, K. Takahashi, and M. Kamada, J. Phys. Chem. B 106, 9380 (2002).
36. G. B. I. Scott, D. A. Fairley, C. G. Freeman, M. J. McEwan, and V. G. Anicich, J. Phys. Chem. A 103, 1073 (1999).
37. D. Sengupta, J. Peeters, and M. T. Nguyen, Chem. Phys. Lett. 283, 91 (1998).
38. M. Kunat, U. Burghaus, and C. Woll, Phys. Chem. Chem. Phys. 5, 4962 (2003).
39. I. Gouzman, R. Brener, and A. Hoffman, J. Vac. Sci. Technol. A 17, 411 (1999).
40. R. T. Girard, O. Tjernberg, G. Chiaia, S. Soderholm, U. O. Karlsson, C. Wigren, H. Nylen, and I. Lindau, Surf. Sci. 373, 409 (1997).
41. B. Keyes, X. Li, and T. J. Coutts (unpublished).