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Volumn 20, Issue 8, 2005, Pages 2030-2037

Investigation of the crystallization mechanisms in indium molybdenum oxide films by vacuum annealing

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARRIER MOBILITY; CRYSTALLIZATION; FILMS; PLASMA DENSITY; STRAIN; SUBSTRATES; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 28844465249     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0248     Document Type: Article
Times cited : (4)

References (35)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.