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Thin Solid Films

Volumn 392, Issue 1, 2001, Pages 22-28

Structural and electrochemical characterization of 'open-structured' ITO films

(2) Wang, Zhongchun a,b Hu, Xingfang a

a SHANGHAI INSTITUTE OF CERAMICS (China)

b INSTITUTO SUPERIOR TÉCNICO (Portugal)

Author keywords

Electrochemistry; Indium tin oxide; Optical properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; GRAIN BOUNDARIES; INFRARED SPECTROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DOPING; SPUTTER DEPOSITION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

INFRARED REFLECTANCE SPECTROSCOPY; RADIO-FREQUENCY DIODE SPUTTERING;

SEMICONDUCTING FILMS;

EID: 0035939547 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01012-4 Document Type: Article

Times cited : (29)

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