Defect tolerance for molecular electronics-based nanoFabrics using built-in self-test procedure

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 305-313

  Tehranipoor, Mohammad ^a  

^a UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; MOLECULAR ELECTRONICS; NANOFABRICS;

BUILT-IN SELF TEST; DATABASE SYSTEMS; DEFECTS; DENSITY (OPTICAL); FAULT TOLERANT COMPUTER SYSTEMS; PROGRAM COMPILERS; RELIABILITY;

NANOSTRUCTURED MATERIALS;

EID: 28444461775     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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