High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al

Ultramicroscopy

Volumn 88, Issue 1, 2001, Pages 25-31

  Mitsuishi, K ^a   Kawasaki, M ^b   Takeguchi, M ^a   Yasuda, H ^a   Furuya, K ^a  

^a Refined Beam Research Unit   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Image simulation; Irradiation; Precipitate; Scanning transmission electron microscopy (STEM)

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; ELECTRON MICROSCOPES; PRECIPITATION (CHEMICAL); XENON;

CRYSTALLINE MEMBRANES;

NANOSTRUCTURED MATERIALS;

ARTICLE; ATOM; CONTROLLED STUDY; CRYSTAL; IMAGE ANALYSIS; MEMBRANE; NONHUMAN; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THICKNESS; ULTRASTRUCTURE ANALYSIS AND ELECTRON MICROSCOPY; VISIBILITY;

EID: 0035009126     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00114-5     Document Type: Article

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