Charge collection degradation in relaxation semiconductor detectors fabricated from silicon

Radiation Effects and Defects in Solids

Volumn 159, Issue 1, 2004, Pages 45-54

  McPherson, M ^a  

^a UNIVERSITY OF KWAZULU NATAL   (South Africa)

Author keywords

Charge collection; Detector; Relaxation; Semiconductor; Silicon

Indexed keywords

LEAKAGE CURRENTS; NEUTRONS; SILICON;

CHARGE COLLECTION; RELAXATION; SILICON DETECTORS;

DETECTORS;

EID: 28344439293     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150310001637952     Document Type: Article

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