New method of carrier trapping time measurement

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 455, Issue 3, 2000, Pages 645-655

  Brodbeck, T J ^a   Chilingarov, A ^a   Sloan, T ^a   Fretwurst, E ^b   Kuhnke, M ^b   Lindstroem, G ^b  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; SILICON SENSORS;

CARRIER TRAPPING TIME; EXPONENTIATED CHARGE CROSSING (ECC); SILICON DETECTORS;

PARTICLE DETECTORS;

EID: 0034515671     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00573-8     Document Type: Article

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