Emission and capture processes in radiation-damaged silicon semiconductor diodes

Current Applied Physics

Volumn 2, Issue 5, 2002, Pages 359-364

  McPherson, M ^a  

^a UNIVERSITY OF LIMPOPO   (South Africa)

Author keywords

Deep level; Diode; Radiation; Semiconductor; Silicon

Indexed keywords

EID: 0036800679     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1567-1739(02)00140-2     Document Type: Article

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