Radiation hardness of silicon detectors: Current status

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 806-814

  Wunstorf, R ^a,b  

^a IEEE   (Germany)

^b TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001397413     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603757     Document Type: Article

References (37)

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