High-resolution photoinduced transient spectroscopy of neutron irradiated bulk silicon

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 476, Issue 3, 2002, Pages 639-644

  Kozlowski, R ^a   Kaminski P ^a   Nossarzewska Orlowska, E ^a  

^a Department of Optical Fiber Technology and and Quantum Systems   (Poland)

Author keywords

Defect levels; Irradiation defects; Neutron irradiation; PITS

Indexed keywords

CARBON; DEFECTS; GROWTH (MATERIALS); NEUTRON IRRADIATION; OXYGEN; SPECTROSCOPIC ANALYSIS;

HIGH-RESOLUTION PHOTOINDUCED TRANSIENT SPECTROSCOPY (HRPITS);

SEMICONDUCTING SILICON;

EID: 0037059419     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01652-7     Document Type: Conference Paper

References (17)