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Volumn 395, Issue 1, 1997, Pages 81-87

Semiconductor detectors for use in high radiation damage environments - Semi-insulating GaAs or silicon?

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRIC PROPERTIES; RADIATION DAMAGE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

EID: 0031208131     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00609-8     Document Type: Article
Times cited : (32)

References (17)
  • 2
    • 0346885895 scopus 로고
    • GaAs radiation detectors in the relaxation regime
    • P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), San Miniato, World Scientific, Singapore, March
    • J. Santana, B.K. Jones, T. Sloan, K. Zdansky, GaAs radiation detectors in the relaxation regime, in: P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), Proc. GaAs, Related Compounds, San Miniato, World Scientific, Singapore, March 1995, pp. 61-66.
    • (1995) Proc. GaAs, Related Compounds , pp. 61-66
    • Santana, J.1    Jones, B.K.2    Sloan, T.3    Zdansky, K.4
  • 3
    • 0041671499 scopus 로고
    • Relaxation semiconductor devices
    • P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), San Miniato, World Scientific, Singapore, March
    • B.K. Jones, J. Santana, T. Sloan, K. Zdansky, Relaxation semiconductor devices, in: P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), Proc. GaAs and Related Compounds, San Miniato, World Scientific, Singapore, March 1995, pp. 73-77.
    • (1995) Proc. GaAs and Related Compounds , pp. 73-77
    • Jones, B.K.1    Santana, J.2    Sloan, T.3    Zdansky, K.4
  • 4
    • 0042172178 scopus 로고
    • Modelling of particle detectors based on semi-insulating GaAs
    • P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), San Miniato, World Scientific, Singapore, March
    • K. Zdansky, J. Santana, B.K. Jones, T. Sloan, Modelling of Particle Detectors based on Semi-Insulating GaAs, in: P.G. Pelfer, J. Ludwig, K. Runge, H.S. Rupprecht (Eds.), Proc. GaAs and Related Compounds, San Miniato, World Scientific, Singapore, March 1995, pp.78-83.
    • (1995) Proc. GaAs and Related Compounds , pp. 78-83
    • Zdansky, K.1    Santana, J.2    Jones, B.K.3    Sloan, T.4
  • 16
    • 0004725926 scopus 로고
    • Imaging of high field regions in SI GaAs under bias, defect recognition and image processing in semiconductors and devices conf.
    • Santander, 1993. IOP London
    • K. Berwick, M.R. Brozel, C.M. Buttar, M. Cowperthwaite, Y. Hou, Imaging of high field regions in SI GaAs under bias, Defect Recognition and Image Processing in Semiconductors and Devices Conf., Santander, 1993. IOP Conf. Ser. No. 135 304-10, IOP London, 1994.
    • (1994) IOP Conf. Ser. No. 135 304-10
    • Berwick, K.1    Brozel, M.R.2    Buttar, C.M.3    Cowperthwaite, M.4    Hou, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.