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Volumn 488, Issue 1-2, 2002, Pages 100-109
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Capacitive effects in neutron-irradiated silicon diodes
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Author keywords
Capacitance; Diode; Neutron; Radiation; Silicon
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Indexed keywords
CAPACITANCE;
CURRENT VOLTAGE CHARACTERISTICS;
NEUTRON IRRADIATION;
PHOTOTUBES;
RADIATION DAMAGE;
RELAXATION PROCESSES;
SEMICONDUCTOR JUNCTIONS;
SILICON;
CAPACITANCE-VOLTAGE CHARACTERISTICS;
SEMICONDUCTOR DIODES;
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EID: 0036680546
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(02)00480-1 Document Type: Article |
Times cited : (32)
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References (27)
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