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Applied Surface Science

Volumn 252, Issue 5, 2005, Pages 1679-1684

Effect of Ni interlayer on stress level of CoSi 2 films in Co/Ni/Si(1 0 0) bi-layered system

(2) Ma, K a Feng, J Y a

a TSINGHUA UNIVERSITY (China)

Author keywords

CoSi 2; Lattice mismatch; Stress; The solid solution

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT COMPOUNDS; LATTICE CONSTANTS; SOLID SOLUTIONS; STRESS ANALYSIS; X RAY DIFFRACTION ANALYSIS;

LATTICE MISMATCH; NI INTERLAYERS;

NICKEL;

EID: 27944499855 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.03.147 Document Type: Article

Times cited : (4)

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