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Volumn 16, Issue 12, 2005, Pages 3137-3141

Selective growth of nanometre scale structures with high resolution using thermal energy in AFM lithography

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DRY ETCHING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; THIN FILMS;

EID: 27944487442     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/16/12/068     Document Type: Article
Times cited : (7)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.