Growth of thin, flat, epitaxial (1 1 1) oriented gold films on c-cut sapphire

Surface Science

Volumn 498, Issue 1-2, 2002, Pages 168-174

  Kastle G ^a   Boyen, H G ^a   Koslowski, B ^a   Plettl, A ^a   Weigl, F ^a   Ziemann, P ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

Aluminum oxide; Epitaxy; Gold; Growth; Metallic films; Niobium; Reflection high energy electron diffraction (RHEED); X ray scattering, diffraction, and reflection

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; GOLD; METALLIC FILMS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SAPPHIRE; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

FLAT FILMS;

SURFACE PHENOMENA;

EID: 0036467576     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01685-5     Document Type: Article

References (23)