The structure of epitaxially grown thin films: A study of niobium on sapphire

Journal of Physics Condensed Matter

Volumn 10, Issue 36, 1998, Pages

  Wildes, A R ^a,b,d   Cowley, R A ^a,c   Ward, R C C ^a   Wells, M R ^a   Jansen, C ^b   Wireen, L ^b   Hill, J P ^c  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b LINKÖPING UNIVERSITY   (Sweden)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); LATTICE CONSTANTS; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; NIOBIUM; SAPPHIRE; SINGLE CRYSTALS; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; X RAY SCATTERING;

CRYSTALLOGRAPHIC STRUCTURE; FILM THICKNESS;

CRYSTAL STRUCTURE;

EID: 0032166634     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/10/36/001     Document Type: Article

References (15)

1. Frank F C and Van der Merwe J 1949 Proc. R. Soc. A 298 216
2. For a review see Jain S C, Harker A H and Cowley R A 1997 Phil. Mag. A 75 1461
3. Levi B G 1996 Phys. Today 49 22
4. Rasmussen F B, Baker J, Nielsen M, Feidenhans'l R and Johnson R J 1997 Phys. Rev. Lett. 79 4413
5. Gibaud A, Cowley R A, McMorrow D F, Ward R C C and Wells M R 1993 Phys. Rev. B 48 14463
6. Reimer P M, Zabel H, Flynn C P and Dura J A 1992 Phys. Rev. B 45 11426
7. Gutekunst G, Mayer J and Ruhle M 1997 Phil. Mag. A 75 1329, 1357
8. Micelli P F, Weatherwax J, Krentsel T and Palmerstom C J 1996 Physica B 221 230
9. Kaganer V M, Köhler R, Schmidbauer M, Opitz R and Jenichen B 1997 Phys. Rev. B 55 1793
10. Kidd P, Fewster P F and Andrew N L 1995 J. Phys. D: Appl. Phys. 28 A133
11. Steirl A, Abromeit A, Brohl K, Metoki N and Zabel H 1992 1973 Surface X-Ray and Neutron Scattering ed H Zabel and I K Robinson (Berlin: Springer)
12. Berry M V Phil. Trans. R. Soc. A 273 611
13. Andrews S R and Cowley R A 1985 J. Phys. C: Solid State Phys. 18 6427
14. Landau L D and Lifshitz E M 1959 1953 Theory of Elasticity (Oxford: Pergamon)
15. Head A K Proc Phys. Soc. B 66 793