Basic characteristics of Pt/SrBi2Ta2O 9/HfO2/Si structure using layer-by-layer crystallization

Journal of the Electrochemical Society

Volumn 152, Issue 8, 2005, Pages

  Wang, Ding Yeong ^a   Chang, Chun Yen ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRYSTALLIZATION; DECOMPOSITION; FERROELECTRICITY;

BUFFER LAYERS; CAPACITANCE RETENTION; METALLORGANIC DECOMPOSITION;

STRONTIUM COMPOUNDS;

EID: 25644432718     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1948967     Document Type: Article

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