SCOPUS 정보 검색 플랫폼

Volumn 482, Issue , 2005, Pages 39-44

Nanoscale measurement of stress and strain by quantitative high-resolution electron microscopy

a CNRS (France)

Author keywords

Dislocations; High resolution electron microscopy; Strain mapping

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELASTIC CONSTANTS; HIGH RESOLUTION ELECTRON MICROSCOPY; STRAIN MEASUREMENT;

ANISOTROPIC ELASTIC THEORY; EDGE DISLOCATION; STRAIN MAPPING; STRAIN TENSOR;

STRESS ANALYSIS;

EID: 25444482208 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/0-87849-964-4.39 Document Type: Conference Paper

Times cited : (5)

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