메뉴 건너뛰기




Volumn 17, Issue 29, 2005, Pages 4687-4699

Impact of layer defects in ferroelectric thin films

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMPURITIES; PIEZOELECTRICITY; POLARIZATION; RANDOM ACCESS STORAGE; SUPERLATTICES;

EID: 22544451601     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/29/010     Document Type: Article
Times cited : (22)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.