Spontaneous Polarization of Neodymium-Substituted Bi4Ti 3O12 Estimated from Epitaxially Grown Thin Films with in-Plane c-Axis Orientations

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 2 B, 2004, Pages

  Watanabe, Takayuki ^a   Kojima, Takashi ^a   Uchida, Hiroshi ^b   Okada, Isao ^b   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SOPHIA UNIVERSITY   (Japan)

Author keywords

Bi4Ti3O12; Bismuth layer structured ferroelectrics; Epitaxial growth; MOCVD; Spontaneous polarization

Indexed keywords

COMPOSITION; ELECTRIC FIELDS; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FILM GROWTH; FLUORESCENCE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NEODYMIUM; POLARIZATION; REMANENCE; THIN FILMS; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

BI4TI3O12; BISMUTH LAYER-STRUCTURED FERROELECTRICS; SPONTANEOUS POLARIZATION; X-RAY FLUORESCENCE;

BISMUTH COMPOUNDS;

EID: 2142643768     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.43.l309     Document Type: Article

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