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Volumn 38, Issue 1-4, 2001, Pages 125-133

Fatigue as a phase transition

Author keywords

Bismuth oxide; Fatigue; PZT; SBT; Wetting

Indexed keywords

FATIGUE OF MATERIALS; MATHEMATICAL MODELS; NANOELECTRONICS; PERCOLATION (SOLID STATE); WETTING;

EID: 22544460425     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580108016925     Document Type: Article
Times cited : (5)

References (47)
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    • J. C. Phillips (in press) derives the same hopping exponent to explain the data in ultrathin (0.5-1.5 nm) metal films observed by N. Markovic et al., Phys. Rev. B62, 2195 (2000).
    • J. C. Phillips (in press) derives the same hopping exponent to explain the data in ultrathin (0.5-1.5 nm) metal films observed by N. Markovic et al., Phys. Rev. B62, 2195 (2000).
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    • preprint
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.