Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering

Journal of Applied Physics

Volumn 97, Issue 8, 2005, Pages

  Di Luccio, T ^a   Scalia, G ^a   Tapfer, L ^a   Morales, P ^b   Traversa, M ^c   Prete, P ^d   Lovergine, N ^c  

^a Centro Ricerche Brindisi   (Italy)

^b ENEA C R CASACCIA   (Italy)

^c UNIVERSITY OF SALENTO   (Italy)

^d CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE SCATTERING; EPILAYERS; RECIPROCAL SPACE MAPS (RSM); SUBSTRATE INTERFACES;

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; DIFFUSION; METALLORGANIC VAPOR PHASE EPITAXY; MICROSTRUCTURE; MORPHOLOGY; STACKING FAULTS; SURFACES; X RAY SCATTERING;

ZINC COMPOUNDS;

EID: 21444441252     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1870101     Document Type: Article

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