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Volumn 319, Issue 1-2, 1998, Pages 49-56

X-ray scattering study of quantum wires and lateral periodic heterostructures

Author keywords

Nanostructures; Surface morphology; X ray diffraction

Indexed keywords

MORPHOLOGY; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WIRES; SURFACE STRUCTURE; X RAY CRYSTALLOGRAPHY;

EID: 0032047165     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01084-5     Document Type: Article
Times cited : (7)

References (27)
  • 2
    • 0345884468 scopus 로고
    • X-ray diffraction studies of single and multiple quantum wells, heterointerfaces and quantum wires of III-V semiconductor compounds
    • K.H. Ploog (Ed.), The Institution of Electrical Engineers, London
    • L. Tapfer, X-ray diffraction studies of single and multiple quantum wells, heterointerfaces and quantum wires of III-V semiconductor compounds, in: K.H. Ploog (Ed.), III-V Quantum System, The Institution of Electrical Engineers, London (1995).
    • (1995) III-V Quantum System
    • Tapfer, L.1
  • 23
    • 0347145575 scopus 로고
    • L. De Caro, P. Sciacovelli, L. Tapfer, M. Hohenstein, F. Phillipp, O. Brandt, H. Lage, K. Ploog, Proc. Multinat. Congr. on Electron Microscopy, Parma (1993); Microscopia Elettronica 14 (suppl.), 143 (1993).
    • (1993) Microscopia Elettronica , vol.14 , Issue.SUPPL. , pp. 143


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.