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Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; ENERGY DISSIPATION; REFLECTION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DOPING; X RAY SCATTERING;

EID: 0035926688     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/10a/318     Document Type: Review
Times cited : (17)

References (16)
  • 7
    • 0004830501 scopus 로고
    • Structural information and defect energies studies by X-ray methods
    • ed B Henderson and A E Hughes (New York: Plenum)
    • Peisl H 1976 Structural information and defect energies studies by X-ray methods Defects and Their Structure in Nonmetallic Solids ed B Henderson and A E Hughes (New York: Plenum) p 381
    • (1976) Defects and Their Structure in Nonmetallic Solids , pp. 381
    • Peisl, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.