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Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages
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Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTOMETERS;
ENERGY DISSIPATION;
REFLECTION;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR DOPING;
X RAY SCATTERING;
MICRODEFECTS;
THREE-CRYSTAL DIFFRACTOMETRY;
X-RAY DIFFUSE SCATTERING (DS);
CRYSTAL DEFECTS;
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EID: 0035926688
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/34/10a/318 Document Type: Review |
Times cited : (17)
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References (16)
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