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Volumn 31, Issue 15, 1998, Pages 1883-1887
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X-ray diffuse scattering characterization of microdefects in highly Te-doped annealed GaAs crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL SYMMETRY;
ELECTROMAGNETIC WAVE SCATTERING;
POINT DEFECTS;
SEMICONDUCTOR DOPING;
TELLURIUM;
X RAY CRYSTALLOGRAPHY;
X-RAY DIFFUSE SCATTERING;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0032493551
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/31/15/017 Document Type: Article |
Times cited : (7)
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References (17)
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