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Volumn 31, Issue 15, 1998, Pages 1883-1887

X-ray diffuse scattering characterization of microdefects in highly Te-doped annealed GaAs crystals

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL SYMMETRY; ELECTROMAGNETIC WAVE SCATTERING; POINT DEFECTS; SEMICONDUCTOR DOPING; TELLURIUM; X RAY CRYSTALLOGRAPHY;

EID: 0032493551     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/15/017     Document Type: Article
Times cited : (7)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.