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Volumn 687, Issue , 2002, Pages 101-106
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On the unification of material strength testing for MEMS applications
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Author keywords
Failure probability; Fracture strength; MEMS; Weibull statistics
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Indexed keywords
FAILURE PROBABILITY;
STRENGTH TESTING;
STRESS RATIO;
BRITTLENESS;
FRACTURE TOUGHNESS;
MATERIALS TESTING;
STRENGTH OF MATERIALS;
WEIBULL DISTRIBUTION;
MICROELECTROMECHANICAL DEVICES;
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EID: 0036350149
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (6)
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