Emission-depth dependence of the signal photoelectron energy spectrum

Surface and Interface Analysis

Volumn 25, Issue 2, 1997, Pages 119-131

  Tilinin, I S ^a   Jablonski, A ^a   Tougaard, S ^b  

^a Polish Acaemy of Sciences   (Poland)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

Elastic scattering; Electron escape depth; IMSP; XPS

Indexed keywords

ELECTRON SCATTERING; ELECTRONS; MONTE CARLO METHODS; PROBABILITY; SPECTRUM ANALYSIS;

ELASTIC COLLISIONS; EMISSION DEPTH DEPENDENCE; KINETIC EQUATION; SIGNAL PHOTOELECTRON ENERGY SPECTRUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031071747     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199702)25:2<119::aid-sia209>3.0.co;2-y     Document Type: Article

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