SCOPUS 정보 검색 플랫폼

Volumn 38, Issue 10 A, 2005, Pages

Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging

e EADQ (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; CURVE FITTING; DEGRADATION; ENERGY GAP; MASKS; SEMICONDUCTOR LASERS; X RAY DIFFRACTION;

CURVATURE; EPITAXIAL LATERAL OVERGROWTH (ELO); LATERAL RESOLUTION; PRODUCTION YIELD;

GALLIUM NITRIDE;

EID: 18744373617 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/38/10A/010 Document Type: Article

Times cited : (15)

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