A novel tapping-mode stylus with a polyvinylidene fluoride unimorph sensor

Measurement Science and Technology

Volumn 15, Issue 3, 2004, Pages 520-528

  Huang, Qiangxian ^a,b   Hatsuzawa, Takeshi ^b  

^a HEFEI UNIVERSITY OF TECHNOLOGY   (China)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

PVDF; Scanning atomic force microscope; Scanning probe microscope; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; EVALUATION; PHOTODIODES; POLYVINYLIDENE CHLORIDES; THIN FILMS; TUNGSTEN;

TAPPING-MODE STYLUS; VIBRATION-DETECTING SENSOR;

PIEZOELECTRIC DEVICES;

POLYVINYLIDENE FLUORIDE; SCANNING FORCE MICROSCOPY;

EID: 1842431479     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/3/004     Document Type: Article

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