Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy

Review of Scientific Instruments

Volumn 70, Issue 10, 1999, Pages 3970-3972

  Muller A D ^a   Muller F ^a   Hietschold, M ^a   Demming, F ^b   Jersch, J ^b   Dickmann, K ^b  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042720258     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150022     Document Type: Article

References (9)

1. A. I. Olia, G. A. Romero, and J. L. Pena, Rev. Sci. Instrum. 67, 1917 (1996).
2. W. Lisowksi, A. H. J. Vandenberg, G. A. M. Kip, and L. J. Hanekamp, Fresenius J. Anal. Chem. 341, 196 (1991).
3. A. Cricenti, E. Paparazzo, M. A. Scarselli, L. Moretto, and S. Selci, Rev. Sci. Instrum. 65, 1558 (1994).
4. R. Scholz, M. Agne, O. Breitenstein, and H. Jenniches, Rev. Sci. Instrum. 68, 3262 (1997).
5. D. K. Biegelsen, S. M. Koch, F. A. Ponce, and J. C. Tramontana, Appl. Phys. Lett. 50, 696 (1987).
6. L. A. Hocklett, S. E. Creager, Rev. Sci. Instrum. 64, 263 (1993).
7. I. Ekwall, E. Wahlström, D. Cleansson, H. Olin, and E. Olsson, Meas. Sci. Technol. 10, 11 (1999).
8. M. Klein and G. Schwitzgebel, Rev. Sci. Instrum. 68, 3099 (1997).
9. H. Wengelnik and H. Neddermeyer, J. Vac. Sci. Technol. A 8, 438 (1990).