State variable extraction to reduce problem complexity for ATPG and design validation

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 820-829

  Wu, Qingwei ^a   Hsiao, Michael S ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN VALIDATION; FAULT COVERAGES; LOGIC SIMULATION; STATE TRANSITION GRAPHS (STG);

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; CORRELATION METHODS; ERROR ANALYSIS; FLIP FLOP CIRCUITS; SEQUENTIAL CIRCUITS; VECTORS;

COMPUTER AIDED DESIGN;

EID: 18144367017     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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